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L6181ADIP28 Arkusz danych(PDF) 4 Page - STMicroelectronics |
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L6181ADIP28 Arkusz danych(HTML) 4 Page - STMicroelectronics |
4 / 10 page ELECTRICAL CHARACTERISTICS (VCC =5V ±5%; VCM = -7 to 7V; Tamb = 0 to 70°C; VSS = -9 to 13.5V; VDD = 9 to 13.5V; unless otherwise specified.) Symbol Parameter Test Condition Min. Typ. Max. Unit fR Frequency Rejected (No Receiver Output) VIN = 2Vpp; (see fig. 8 and note 7) 5 MHz Note: 1) The algebric convention, where the less positive (more negative) is designed the minimum 2) With the voltage VIA or (VIB) ranging between ±15V, while VIB or (VIA) is open or grounded, the resultant input current IIA or (IIB) shall remain within the shaded region shown in the graph in Fig.1. 3) Either Point B’ or Point A’ is grounded in Figure 1 4) VICC measured from grounded to (+) input with (-) input grounded VICC measured from grounded to (+) input with (-) input grounded 5) Not more than one output should be shorted at a time and for less than 1 seond 6) The sum of the product of the maximum supply currents and voltages cannot exceed themaximum power dissipation 7) A: The conditions for the inpit switching from VIOCL to VIOCH mode is: Vid in start bit ”spacing condition”for less than TpVioch (5ms). B: The conditions for the input switching from VIOCH to VIOCL mode is: Vid > WW2 for greater than TpVIOCL (200ms) 8) An example of a frequency response plot meeting the rejection/acceptance requirements is provided in figure 8. LINE TRANSIENT IMMUNITY (Considering the following cases; powered ON, Powered OFF-LOW im- pedance power supply and powered OFF-HIGH impedance supply) Symbol Parameter Test Condition Min. Typ. Max. Unit ESD Static tested per MIL-STD-883 (see note 9) 2KV EOS Stress transient pulse both polarities for 100 µs (see note 9 and Fig. 2) 50 V Note: 9) All pins are required to withstand this parameters. 10) Input pins are required to withstand fig.2 without any degradation to the circuit. 11) The balance test requirement can be met by use of a current limit circuit which reduces the input bias current Iib (see figure 7) for input voltages below a threshold voltage given by (Iib x 1K) - 400mV. Figure 1: Input Current Voltage Mesurements L6180 - L6181 4/10 |
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