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STQ1NE10L Arkusz danych(PDF) 8 Page - STMicroelectronics |
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STQ1NE10L Arkusz danych(HTML) 8 Page - STMicroelectronics |
8 / 13 page Obsolete Product(s) - Obsolete Product(s) Test circuit STQ1NE10L 8/13 3 Test circuit Figure 12. Switching times test circuit for resistive load Figure 13. Gate charge test circuit Figure 14. Test circuit for inductive load switching and diode recovery times Figure 15. Unclamped Inductive load test circuit Figure 16. Unclamped inductive waveform |
Podobny numer części - STQ1NE10L_07 |
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Podobny opis - STQ1NE10L_07 |
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