ADXL180 datasheet(41/56 Pages) AD

Numer części	ADXL180

Szczegółowy opis	Configurable, High g, iMEMS Accelerometer

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ADXL180

Rev. 0 | Page 41 of 56

ERROR DETECTION

OVERVIEW

The ADXL180 monitors its internal operation and reports

errors. The error reporting codes differ depending on whether

the state vector has been enabled. Table 39 describes the errors

and the specific codes transmitted in various configurations.

The state vector allows the ADXL180 to report specific errors if

enabled. If the state vector is not enabled, a single error code is

sent regardless of the type of error. The error code is transmitted

every 228 μs in asynchronous mode until power down. The

error code is transmitted in response to every synchronization

pulse in synchronous mode until power down.

PARITY ERROR DUE TO COMMUNICATIONS

PROTOCOL CONFIGURATION BIT ERROR

As shown in Table 39, an error code is generated if the parity of

the ADXL180 device OTP memory is incorrect. However, if this

error is due to a parity error in one of the ERC, SVD, DAT, or MAN

bits that govern the format of the transmitted message, the error

code is transmitted in an alternate data format. Receive system

designs that recognize repeated message transmissions, wrong

data lengths, and incorrect Manchester encoding help to detect

more easily that an error code is being set.

Table 39. Status/Error Coding

Error

State Vector Enabled

State Vector Disabled

Error Reporting Active in Phases

8-Bit

Data Mode

10-Bit

Data Mode

8-Bit

Data Mode

10-Bit

Data Mode

Configuration Error

0x7F

127d

0x1F9

505d

0x7D

125d

0x1F4

500d

2

Offset Error

0x7E

126d

0x1F8

504d

0x7D

125d

0x1F4

500d

5

Self-Test Error

0x7D

125d

0x1F7

503d

0x7D

125d

0x1F4

500d

4, 51

OTP Parity Error

0x7C

124d

0x1F6

502d

0x7D

125d

0x1F4

500d

4, 5

Device OK

0x7B

123d

0x1E7

487d

0x7B

123d

0x1E7

487d

3

Device Not OK (NOK)

0x7A

122d

0x1F4

500d

0x7D

125d

0x1F4

500d

3, 4, 5

1 A self-test error reported during Phase 5 indicates a failure of the internal self-test circuit, not a sensor self-test error.

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