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TS822 Arkusz danych(PDF) 3 Page - STMicroelectronics |
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TS822 Arkusz danych(HTML) 3 Page - STMicroelectronics |
3 / 9 page TS822 Electrical characteristics 3/9 2 Electrical characteristics Table 3. TS822 (2% precision) Tamb = 25°C (1) (unless otherwise specified) Symbol Parameter Test conditions Min. Typ. Max. Unit Vk Reverse breakdown voltage Ik = 100μA 2.45 2.5 2.55 V Reverse breakdown voltage tolerance Ik = 100μA -40°C < Tamb < +85°C -50 -66 50 66 mV Ik-min Minimum operating current T = 25°C 40 50 μA -40°C < Tamb < +85°C 60 ΔVref/ΔT Average temperature coefficient Ik = 100μA 30 100 ppm/°C ΔVk/ΔIk Reverse breakdown voltage change with operating current range Ik-min < Ik < 1mA -40°C < Tamb < +85°C 0.4 1 1.2 mV 1mA < Ik < 15mA -40°C < Tamb < +85°C 2.5 8 10 Rka Reverse static impedance Ik = Ik-min to 1mA -40°C < Tamb < +85°C 0.4 1 1.2 Ω Ik = 1 to 15mA -40°C < Tamb < +85°C 0.2 0.6 0.7 Kvh Long term stability Ik = 100μA, t = 1000hrs 120 ppm En Wide band noise Ik = 100μA, 10Hz < f < 10kHz 35 nV/ √Hz 1. Limits are 100% production tested at 25°C. Behavior at temperature range limits is guaranteed by correlation and design. Table 4. TS822A (1% precision) Tamb = 25°C (1) (unless otherwise specified) Symbol Parameter Test conditions Min. Typ. Max. Unit Vk Reverse breakdown voltage Ik = 100μA 2.475 2.5 2.525 V Reverse breakdown voltage tolerance Ik = 100μA -40°C < Tamb < +85°C -25 -41 25 41 mV Ik-min Minimum operating current T = 25°C 40 50 μA -40°C < Tamb < +85°C 60 ΔVref/ΔT Average temperature coefficient Ik = 100μA 30 100 ppm/°C ΔVk/ΔIk Reverse breakdown voltage change with operating current range Ik-min < Ik < 1mA -40°C < Tamb < +85°C 0.4 1 1.2 mV 1mA < Ik < 15mA -40°C < Tamb < +85°C 2.5 8 10 Rka Reverse static impedance Ik = Ik-min to 1mA -40°C < Tamb < +85°C 0.4 1 1.2 Ω Ik = 1mA to 15mA -40°C < Tamb < +85°C 0.2 0.6 0.7 Kvh Long term stability Ik = 100μA, t = 1000hrs 120 ppm En Wide band noise Ik = 100μA, 10Hz < f < 10kHz 35 nV/ √Hz 1. Limits are 100% production tested at 25°C. Behavior at temperature range limits is guaranteed by correlation and design. |
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