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2SK3157-E Arkusz danych(PDF) 4 Page - Renesas Technology Corp |
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2SK3157-E Arkusz danych(HTML) 4 Page - Renesas Technology Corp |
4 / 8 page 2SK3157 Rev.3.00 Sep 07, 2005 page 4 of 7 Case Temperature TC (°C) Static Drain to Source on State Resistance vs. Temperature Forward Transfer Admittance vs. Drain Current Drain Current ID (A) Body to Drain Diode Reverse Recovery Time Reverse Drain Current IDR (A) Typical Capacitance vs. Drain to Source Voltage Drain to Source Voltage VDS (V) Dynamic Input Characteristics Gate Charge Qg (nc) Switching Characteristics Drain Current ID (A) 250 200 150 100 50 –40 0 40 80 120 160 0 0.1 0.2 1 520 30 1 3 0.3 0.1 Pulse Test 10 10 ID = 20 A VGS = 4 V 10 V 20 A 5, 10 A 100 0.5 2 50 100 VDS = 10 V Pulse Test 25 °C Tc = –25 °C 75 °C 5, 10 A 0.1 1 3 10 100 0.3 30 010 20 30 40 50 10000 1000 3000 300 10 30 100 200 160 120 80 40 0 20 16 12 8 4 40 80 120 160 200 0 5000 500 200 100 50 0.1 0.2 1 510 1000 200 100 20 50 10 500 ID = 20 A VGS VDS 20 10 0.5 2 20 VDD = 100 V 50 V 25 V VDD = 100 V 50 V 25 V VGS = 0 f = 1 MHz Ciss Coss Crss 1000 tr VGS = 10 V, VDD = 30 V PW = 5 µs, duty < 1 % tf td(on) td(off) 50 2000 di / dt = 50 A / µs VGS = 0, Ta = 25°C |
Podobny numer części - 2SK3157-E |
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Podobny opis - 2SK3157-E |
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