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CDC536DL Arkusz danych(PDF) 1 Page - Texas Instruments

Numer części CDC536DL
Szczegółowy opis  3.3-V PHASE-LOCK LOOP CLOCK DRIVER WITH 3-STATE OUTPUTS
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CDC536DL Arkusz danych(HTML) 1 Page - Texas Instruments

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CDC536
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS378F – APRIL 1994 – REVISED OCTOBER 1998
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
D Low-Output Skew for Clock-Distribution
and Clock-Generation Applications
D Operates at 3.3-V VCC
D Distributes One Clock Input to Six Outputs
D One Select Input Configures Three Outputs
to Operate at One-Half or Double the Input
Frequency
D No External RC Network Required
D External Feedback Pin (FBIN) Is Used to
Synchronize the Outputs to the Clock Input
D Application for Synchronous DRAM,
High-Speed Microprocessor
D Negative-Edge-Triggered Clear for
Half-Frequency Outputs
D TTL-Compatible Inputs and Outputs
D Outputs Drive 50-Ω Parallel-Terminated
Transmission Lines
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D Distributed VCC and Ground Pins Reduce
Switching Noise
D Packaged in Plastic 28-Pin Shrink Small
Outline Package
description
The CDC536 is a high-performance, low-skew, low-jitter clock driver. It uses a phase-lock loop (PLL) to precisely
align, in both frequency and phase, the clock output signals to the clock input (CLKIN) signal. It is specifically
designed for use with synchronous DRAMs and popular microprocessors operating at speeds from 50 MHz to
100 MHz or down to 25 MHz on outputs configured as half-frequency outputs. The CDC536 operates at 3.3-V
VCC and is designed to drive a 50-W transmission line.
The feedback input (FBIN) is used to synchronize the output clocks in frequency and phase to the input clock
(CLKIN). One of the six output clocks must be fed back to FBIN for the PLL to maintain synchronization between
CLKIN and the outputs. The output used as the feedback pin is synchronized to the same frequency as CLKIN.
The Y outputs can be configured to switch in phase and at the same frequency as CLKIN. The select (SEL)
input configures three Y outputs to operate at one-half or double the CLKIN frequency depending on which pin
is fed back to FBIN (see Tables 1 and 2). All output signal duty cycles are adjusted to 50% independent of the
duty cycle at the input clock.
Output-enable (OE) is provided for output control. When OE is high, the outputs are in the high-impedance state.
When OE is low, the outputs are active. TEST is used for factory testing of the device and can be use to bypass
the PLL. TEST should be strapped to GND for normal operation.
Unlike many products containing PLLs, the CDC536 does not require external RC networks. The loop filter for
the PLL is included on-chip, minimizing component count, board space, and cost.
Copyright
© 1998, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
EPIC-
ΙΙB is a trademark of Texas Instruments Incorporated.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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28
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AVCC
AGND
CLKIN
SEL
OE
GND
1Y1
VCC
GND
1Y2
VCC
GND
1Y3
VCC
AVCC
AGND
FBIN
TEST
CLR
VCC
2Y1
GND
VCC
2Y2
GND
VCC
2Y3
GND
DB OR DL PACKAGE
(TOP VIEW)


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