CY74FCT16823T

CY74FCT162823T

3

Parameter

Description

Test Conditions

Min.

Max.

Unit

Input HIGH Voltage

2.0

V

Input LOW Voltage

0.8

V

100

mV

Input Clamp Diode Voltage

−0.7

−1.2

V

Input HIGH Current

±1

µA

Input LOW Current

±1

µA

High Impedance Output Current

(Three-State Output pins)

±1

µA

High Impedance Output Current

(Three-State Output pins)

±1

µA

−80

−140

−200

mA

−50

−180

mA

Power-Off Disable

[8]

1

µA

Output Drive Characteristics for CY74FCT16823T

Parameter

Description

Test Conditions

Min.

Max.

Unit

Output HIGH Voltage

2.5

3.5

V

2.4

3.5

2.0

3.0

Output LOW Voltage

0.2

0.55

V

Output Drive Characteristics for CY74FCT162823T

Parameter

Description

Test Conditions

Min.

Max.

Unit

60

115

150

mA

−60

−115

−150

mA

Output HIGH Voltage

2.4

3.3

V

Output LOW Voltage

0.3

0.55

V

Parameter

Description

Test Conditions

Max.

Unit

Input Capacitance

4.5

6.0

pF

Output Capacitance

5.5

8.0

pF

Notes:

5.

6.

This input is specified but not tested.

7.

Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting

of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter

8.

Tested at +25˚C.

9.

This parameter is specified but not tested.