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SN74CBT16233 Arkusz danych(PDF) 1 Page - Texas Instruments |
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SN74CBT16233 Arkusz danych(HTML) 1 Page - Texas Instruments |
1 / 5 page SN74CBT16233 16-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER SCDS010H – MAY 1995 – REVISED OCTOBER 1998 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D 5-Ω Switch Connection Between Two Ports D TTL-Compatible Input Levels D Package Options Include Plastic Thin Shrink Small-Outline (DGG), Thin Very Small-Outline (DGV), and 300-mil Shrink Small-Outline (DL) Packages description The SN74CBT16233 is a 16-bit 1-of-2 FET multiplexer/demultiplexer used in applications in which two separate data paths must be multiplexed onto, or demultiplexed from, a single path. This device can be used for memory interleaving, where two different banks of memory need to be addressed simultaneously. The device can be used as two 8-bit to 16-bit multiplexers or as one 16-bit to 32-bit multiplexer. Two select (SEL1 and SEL2) inputs control the data flow. When the TEST inputs are asserted, the A port is connected to both the B1 and the B2 ports. SEL1, SEL2, and the TEST inputs can be driven with a 5-V CMOS, a 5-V TTL, or a low-voltage TTL driver. The device is specified by design not to have through current when switching directions. The SN74CBT16233 is characterized for operation from 0 °C to 70°C. FUNCTION TABLE (each multiplexer/demultiplexer) INPUTS FUNCTION SEL TEST FUNCTION L L A = B1 H L A = B2 X H A = B1 and A = B2 DGG, DGV, OR DL PACKAGE (TOP VIEW) 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 56 55 54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 1A 2B1 2B2 3A 4B1 4B2 5A 6B1 6B2 7A 8B1 8B2 GND VCC 9A 10B1 10B2 11A 12B1 12B2 13A 14B1 14B2 15A 16B1 16B2 TEST1 TEST2 1B1 1B2 2A 3B1 3B2 4A 5B1 5B2 6A 7B1 7B2 8A GND VCC 9B1 9B2 10A 11B1 11B2 12A 13B1 13B2 14A 15B1 15B2 16A SEL1 SEL2 PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 1998, Texas Instruments Incorporated Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. |
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