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TL287IJG Arkusz danych(PDF) 6 Page - Texas Instruments |
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TL287IJG Arkusz danych(HTML) 6 Page - Texas Instruments |
6 / 20 page TL087, TL088, TL287, TL288 JFET-INPUT OPERATIONAL AMPLIFIERS SLOS082A – D2484, MARCH 1979 – REVISED JANUARY 1993 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 6 typical values Typical values as presented in this data sheet represent the median (50% point) of device parametric performance. input bias and offset current At the picoamp bias current level typical of these JFET operational amplifiers, accurate measurement of the bias current becomes difficult. Not only does this measurement require a picoammeter, but test socket leakages can easily exceed the actual device bias currents. To accurately measure these small currents, Texas Instruments uses a two-step process. The socket leakage is measured using picoammeters with bias voltages applied, but with no device in the socket. The device is then inserted in the socket and a second test that measures both the socket leakage and the device input bias current is performed. The two measurements are then subtracted algebraically to determine the bias current of the device. |
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