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NE1617ADS Arkusz danych(PDF) 4 Page - NXP Semiconductors |
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NE1617ADS Arkusz danych(HTML) 4 Page - NXP Semiconductors |
4 / 27 page NE1617A_4 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 04 — 30 July 2009 4 of 27 NXP Semiconductors NE1617A Temperature monitor for microprocessor systems 6. Pinning information 6.1 Pinning 6.2 Pin description [1] These pins should either float or be tied to ground. [2] VDD pin should be decoupled by a 0.1 µF capacitor. Fig 2. Pin configuration for SSOP16 (QSOP16) NE1617ADS TEST1 TEST16 VDD STBY D+ SCLK D − TEST13 TEST5 SDATA ADD1 ALERT GND ADD0 GND TEST9 002aad509 1 2 3 4 5 6 7 8 10 9 12 11 14 13 16 15 Table 2. Pin description Symbol Pin Description TEST1 1 test pin; factory use only[1] VDD 2 positive supply[2] D+ 3 positive side of remote sensor D − 4 negative side of remote sensor TEST5 5 test pin; factory use only[1] ADD1 6 device address 1 (3-state) GND 7, 8 ground TEST9 9 test pin; factory use only[1] ADD0 10 device address 0 (3-state) ALERT 11 open-drain output used as interrupt or SMBus alert SDATA 12 SMBus serial data input/output; open-drain TEST13 13 test pin; factory use only[1] SCLK 14 SMBus clock input STBY 15 hardware standby input HIGH = normal operating mode LOW = standby mode TEST16 16 test pin; factory use only[1] |
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