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ISL12022M Arkusz danych(PDF) 5 Page - Intersil Corporation |
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ISL12022M Arkusz danych(HTML) 5 Page - Intersil Corporation |
5 / 27 page 5 FN6668.5 July 10, 2009 tSU:STO STOP Condition Setup Time From SCL rising edge crossing 70% of VDD, to SDA rising edge crossing 30% of VDD. 600 ns tHD:STO STOP Condition Hold Time From SDA rising edge to SCL falling edge. Both crossing 70% of VDD. 600 ns tDH Output Data Hold Time From SCL falling edge crossing 30% of VDD, until SDA enters the 30% to 70% of VDD window. 0ns tR SDA and SCL Rise Time From 30% to 70% of VDD. 20 + 0.1 x Cb 300 ns 8, 9 tF SDA and SCL Fall Time From 70% to 30% of VDD. 20 + 0.1 x Cb 300 ns 8, 9 Cb Capacitive Loading of SDA or SCL Total on-chip and off-chip 10 400 pF 8, 9 RPU SDA and SCL Bus Pull-up Resistor Off-chip Maximum is determined by tR and tF. For Cb = 400pF, max is about 2k Ω~2.5kΩ. For Cb = 40pF, max is about 15k Ω~20kΩ 1k Ω 8, 9 NOTES: 3. Temperature Conversion is inactive below VBAT = 2.7V. Device operation is not guaranteed at VBAT <1.8V. 4. IRQ/FOUT inactive. 5. VDD > VBAT +VBATHYS 6. Specified at +25°C. 7. In order to ensure proper timekeeping, the VDD SR- specification must be followed. 8. Limits should be considered typical and are not production tested. 9. These are I2C specific parameters and are not tested, however, they are used to set conditions for testing devices to validate specification. 10. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by characterization and are not production tested. 11. Minimum VDD and/or VBAT of 1V to sustain the SRAM. The value is based on characterization and it is not tested. I2C Interface Specifications Test Conditions: VDD = +2.7 to +5.5V, Temperature = -40°C to +85°C, unless otherwise specified. (Continued) SYMBOL PARAMETER TEST CONDITIONS MIN (Note 10) TYP (Note 6) MAX (Note 10) UNITS NOTES ISL12022M |
Podobny numer części - ISL12022M_09 |
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Podobny opis - ISL12022M_09 |
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