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ADXL346BCCZ-RL Datasheet(Arkusz danych) 3 Page - Analog Devices

Numer części ADXL346BCCZ-RL
Szczegółowy opis  3-Axis, ±2 g/±4 g/±8 g/±16 g Ultralow Power Digital Accelerometer
Pobierz  32 Pages
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Producent  AD [Analog Devices]
Strona internetowa  http://www.analog.com
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Preliminary Technical Data
ADXL346
Rev. PrC | Page 3 of 32
SPECIFICATIONS
TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V, acceleration = 0 g, CS = 10 F tantalum, CIO = 0.1 F, ODR = 800 Hz, unless otherwise noted.
Table 1. Specifications1
Parameter
Test Conditions
Min
Typ
Max
Unit
SENSOR INPUT
Each axis
Measurement Range
User selectable
±2, ±4, ±8, ±16
g
Nonlinearity
Percentage of full scale
±0.5
%
Inter-Axis Alignment Error
±0.1
Degrees
Cross-Axis Sensitivity2
±1
%
OUTPUT RESOLUTION
Each axis
All g Ranges
10-bit resolution
10
Bits
±2 g Range
Full resolution
10
Bits
±4 g Range
Full resolution
11
Bits
±8 g Range
Full resolution
12
Bits
±16 g Range
Full resolution
13
Bits
SENSITIVITY
Each axis
Sensitivity at XOUT, YOUT, ZOUT
±2 g, 10-bit or full resolution
230
256
282
LSB/g
Scale Factor at XOUT, YOUT, ZOUT
±2 g, 10-bit or full resolution
3.5
3.9
4.3
mg/LSB
Sensitivity at XOUT, YOUT, ZOUT
±4 g, 10-bit resolution
115
128
141
LSB/g
Scale Factor at XOUT, YOUT, ZOUT
±4 g, 10-bit resolution
7.1
7.8
8.7
mg/LSB
Sensitivity at XOUT, YOUT, ZOUT
±8 g, 10-bit resolution
57
64
71
LSB/g
Scale Factor at XOUT, YOUT, ZOUT
±8 g, 10-bit resolution
14.1
15.6
17.5
mg/LSB
Sensitivity at XOUT, YOUT, ZOUT
±16 g, 10-bit resolution
29
32
35
LSB/g
Scale Factor at XOUT, YOUT, ZOUT
±16 g, 10-bit resolution
28.6
31.2
34.5
mg/LSB
Sensitivity Change Due to Temperature
±0.01
%/°C
0 g OFFSET
Each axis
0 g Output for XOUT, YOUT, ZOUT
−150
+150
mg
0 g Offset vs. Temperature for x-, y-, z-Axes
<±1.0
mg/°C
NOISE
x-, y-Axes
ODR = 100 Hz for ±2 g, 10-bit or
full resolution
<1.0
LSB rms
z-Axis
ODR = 100 Hz for ±2 g, 10-bit or
full resolution
<1.5
LSB rms
OUTPUT DATA RATE AND BANDWIDTH
User selectable
Output Data Rate (ODR)3
6.25
3200
Hz
SELF-TEST4
Output Change in x-Axis
0.27
1.55
g
Output Change in y-Axis
−1.55
−0.27
g
Output Change in z-Axis
0.40
1.95
g
POWER SUPPLY
Operating Voltage Range (VS)
1.7
2.5
2.75
V
Interface Voltage Range (VDD I/O)
1.7
1.8
VS
V
Supply Current
ODR ≥ 100 Hz
140
µA
ODR < 10 Hz
35
µA
Standby Mode Leakage Current
1
10
µA
Turn-On and Wake-Up Time5
ODR = 3200 Hz
1.4
ms
TEMPERATURE
Operating Temperature Range
−40
+85
°C
WEIGHT
Device Weight
18
mg
1 All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
2 Cross-axis sensitivity is defined as coupling between any two axes.
3 Bandwidth is the −3 dB frequency and is half the output data rate, bandwidth = ODR/2.
4 Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register) minus the output (g) when the SELF_TEST bit = 0 (in the
DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate). The part
needs to be in normal power operation (LOW_POWER bit = 0 in BW_RATE register) for self-test to operate correctly.
5 Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For
other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate).




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