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SL10051N2DL Arkusz danych(PDF) 6 Page - ABC Taiwan Electronics Corp |
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SL10051N2DL Arkusz danych(HTML) 6 Page - ABC Taiwan Electronics Corp |
6 / 6 page not change more Inductance shall than ±30% AR-001A High temp. Resistance test Resistance test Humidity ( Temp. cycle ) Thermal shock test Applied current : Per spec. Temperature : 105±2℃ Time : 500 hours Total : 50 cycles Applied current : Per spec. Humidity : 90 ~ 95% Time : 500 hours Temperature : 40±2℃ 15 minutes 15 minutes Room temp. Room temp. -25±2 ℃ 30 minutes 30 minutes 85±2 ℃ More than 90% of the Shall be covered terminal electrode SPECIFICATION FOR APPROVAL WOUND CHIP INDUCTOR With fresh solder. Solderability Test item Ⅸ﹒ RELIABILITY TEST: PROD. NAME REF : Preheat : 150±25 for 60 seconds ℃ Solder : Sn96.5 / Ag3 / Cu0.5 or equivalent Test condition Solder temp. : 235±5℃ Dip time : 4±1 seconds Flux : Rosin ABC'S ITEM NO. ABC'S DWG NO. Specification SL1005□□□□L□-□□□ PAGE: 6 |
Podobny numer części - SL10051N2DL |
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Podobny opis - SL10051N2DL |
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