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5V7855-DPK Arkusz danych(PDF) 11 Page - Integrated Device Technology |
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5V7855-DPK Arkusz danych(HTML) 11 Page - Integrated Device Technology |
11 / 14 page IDT5V7855-DPK REVISION A MARCH 11, 2010 11 ©2010 Integrated Device Technology, Inc. IDT5V7855 Data Sheet EEPROM PROGRAMMABLE PLL DIE FOR LVCMOS CRYSTAL OSCILLATOR Parameter Measurement Information 3.3V Output Load AC Test Circuit Cycle-to-Cycle Jitter Output Duty Cycle/Pulse Width/Period 2.5V Output Load AC Test Circuit Period Jitter Output Rise/Fall Time SCOPE Qx LVCMOS GND VDD 1.65V±0.15V 1.65V±0.15V OUT ➤ ➤ tcycle n tcycle n+1 tjit(cc) = |tcycle n – tcycle n+1| 1000 Cycles OUT t PERIOD t PW t PERIOD odc = V DD 2 x 100% t PW SCOPE Qx LVCMOS GND 1.25V±0.15V VDD -1.25V±0.15V VOH VREF VOL Mean Period (First edge after trigger) Reference Point (Trigger Edge) 1 σ contains 68.26% of all measurements 2 σ contains 95.4% of all measurements 3 σ contains 99.73% of all measurements 4 σ contains 99.99366% of all measurements 6 σ contains (100-1.973x10-7)% of all measurements Histogram 20% 80% 80% 20% tR t F OUT |
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