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FQD5N50C Arkusz danych(PDF) 1 Page - Fairchild Semiconductor

Numer części FQD5N50C
Szczegółowy opis  500V N-Channel MOSFET
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Producent  FAIRCHILD [Fairchild Semiconductor]
Strona internetowa  http://www.fairchildsemi.com
Logo FAIRCHILD - Fairchild Semiconductor

FQD5N50C Arkusz danych(HTML) 1 Page - Fairchild Semiconductor

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FQD5N50C / FQU5N50C
500V N-Channel MOSFET
General Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary,
planar stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the
avalanche and commutation mode. These devices are well
suited for high efficiency switched mode power supplies,
active power factor correction, electronic lamp ballasts
based on half bridge topology.
Features
• 4.0A, 500V, RDS(on) = 1.4 Ω @VGS = 10 V
• Low gate charge ( typical 18nC)
• Low Crss ( typical 15pF)
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
Absolute Maximum Ratings T
C = 25°C unless otherwise noted
Thermal Characteristics
* When mounted on the minimum pad size recommended (PCB Mount)
Symbol
Parameter
FQD5N50C / FQU5N50C
Units
VDSS
Drain-Source Voltage
500
V
ID
Drain Current
- Continuous (TC = 25°C)
4A
- Continuous (TC = 100°C)
2.4
A
IDM
Drain Current
- Pulsed
(Note 1)
16
A
VGSS
Gate-Source Voltage
± 30
V
EAS
Single Pulsed Avalanche Energy
(Note 2)
300
mJ
IAR
Avalanche Current
(Note 1)
4A
EAR
Repetitive Avalanche Energy
(Note 1)
4.8
mJ
dv/dt
Peak Diode Recovery dv/dt
(Note 3)
4.5
V/ns
PD
Power Dissipation (TA = 25°C)*
2.5
W
Power Dissipation (TC = 25°C)
48
W
- Derate above 25°C
0.38
W/°C
TJ, TSTG
Operating and Storage Temperature Range
-55 to +150
°C
TL
Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
300
°C
Symbol
Parameter
Typ
Max
Units
RθJC
Thermal Resistance, Junction-to-Case
-
2.6
°C/W
RθJA
Thermal Resistance, Junction-to-Ambient *
-
50
°C/W
RθJA
Thermal Resistance, Junction-to-Ambient
-
110
°C/W
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S
D
G
I-PAK
FQU Series
D-PAK
FQD Series
GS
D
GS
D
October 2008
QFET
®
• RoHS Compliant
©2008 Fairchild Semiconductor Internationa
Rev. A1, October 2008


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