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74HCT1G66 Arkusz danych(PDF) 11 Page - NXP Semiconductors |
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74HCT1G66 Arkusz danych(HTML) 11 Page - NXP Semiconductors |
11 / 18 page 74HC_HCT1G66_4 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 04 — 19 December 2008 11 of 18 NXP Semiconductors 74HC1G66; 74HCT1G66 Single-pole single-throw analog switch 11.3 Test circuits and graphs f(−3dB) −3 dB frequency response RL = 50 Ω; CL = 10 pF; see Figure 12 and 13 VCC = 4.5 V - 180 - MHz VCC = 9.0 V - 200 - MHz αiso isolation (OFF-state) RL = 600 Ω; fi = 1 MHz; see Figure 14 and 15 VCC = 4.5 V - −50 - dB VCC = 9.0 V - −50 - dB Table 12. Additional dynamic characteristics for 74HC1G66 and 74HCT1G66 …continued GND = 0 V; tr = tf = 6.0 ns; CL = 50 pF; unless otherwise specified. All typical values are measured at Tamb =25 °C. Symbol Parameter Conditions Min Typ Max Unit Fig 11. Test circuit for measuring total harmonic distortion 10 µF 2RL 2RL CL fi VIH VO VCC VCC E D Y/Z Z/Y 001aai678 With fi = 1 MHz adjust the switch input voltage for a 0 dBm level at the switch output, (0 dBm = 1 mW into 50 Ω). Then Increase the input frequency until the dB meter reads −3dB Fig 12. Test circuit for measuring the −3 dB frequency response 0.1 µF 2RL 2RL CL fi VIH VO VCC VCC E dB Y/Z Z/Y 001aai680 |
Podobny numer części - 74HCT1G66 |
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Podobny opis - 74HCT1G66 |
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