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74HCT11N Arkusz danych(PDF) 7 Page - NXP Semiconductors |
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74HCT11N Arkusz danych(HTML) 7 Page - NXP Semiconductors |
7 / 15 page 74HC_HCT11_4 © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 04 — 25 March 2010 7 of 15 NXP Semiconductors 74HC11; 74HCT11 Triple 3-input AND gate Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. Fig 7. Load circuitry for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 9. Test data Type Input Load Test VI tr, tf CL 74HC11 VCC 6.0 ns 15 pF, 50 pF tPLH, tPHL 74HCT11 3.0 V 6.0 ns 15 pF, 50 pF tPLH, tPHL |
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Podobny opis - 74HCT11N |
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