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74HCT164DB Arkusz danych(PDF) 11 Page - NXP Semiconductors |
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74HCT164DB Arkusz danych(HTML) 11 Page - NXP Semiconductors |
11 / 20 page 74HC_HCT164_4 © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 04 — 2 February 2010 11 of 20 NXP Semiconductors 74HC164; 74HCT164 8-bit serial-in, parallel-out shift register Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. Fig 10. Test circuit for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 9. Test data Type Input Load Test VI tr, tf CL 74HC164 VCC 6.0 ns 15 pF, 50 pF tPLH, tPHL 74HCT164 3.0 V 6.0 ns 15 pF, 50 pF tPLH, tPHL |
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