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74HC21D Arkusz danych(PDF) 7 Page - NXP Semiconductors |
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74HC21D Arkusz danych(HTML) 7 Page - NXP Semiconductors |
7 / 14 page 74HC21_5 © NXP B.V. 2009. All rights reserved. Product data sheet Rev. 05 — 7 May 2009 7 of 14 NXP Semiconductors 74HC21 Dual 4-input AND gate Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. Fig 8. Test circuit for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 9. Test data Type Input Load Test VI tr, tf CL 74HC21 VCC 6.0 ns 15 pF, 50 pF tPLH, tPHL |
Podobny numer części - 74HC21D |
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Podobny opis - 74HC21D |
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