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74LVTN16244BBQ Arkusz danych(PDF) 10 Page - NXP Semiconductors |
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10 / 16 page 74LVTN16244B_2 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 02 — 23 March 2010 10 of 16 NXP Semiconductors 74LVTN16244B 3.3 V 16-bit buffer/driver; 3-state Test data is given in Table 9. Definitions test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. VEXT = External voltage for measuring switching times. Fig 7. Load circuit for measuring switching times VEXT VCC VI VO 001aae235 DUT CL RT RL RL PULSE GENERATOR VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf Table 9. Test data Input Load VEXT VI fi tW tr, tf CL RL tPHZ, tPZH tPLZ, tPZL tPLH, tPHL 2.7 V ≤ 10 MHz 500 ns ≤ 2.5 ns 50 pF 500 Ω GND 6 V open |
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