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DAC3282IRGZR Arkusz danych(PDF) 2 Page - Texas Instruments |
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DAC3282IRGZR Arkusz danych(HTML) 2 Page - Texas Instruments |
2 / 51 page 16 16 x sin(x) x sin(x) x2 x2 1.2 V Reference 16-b DAC 16-b DAC ControlInterface Temp Sensor ClockDistribution A gain B gain FrameStrobe EXTIO BIASJ IOUTA1 IOUTA2 IOUTB1 IOUTB2 DACCLKP DACCLKN DATACLKP DATACLKN D7P D7N D0P D0N FRAMEP FRAMEN OSTRP OSTRN A offset B offset AVDD33 LVPECL LVDS LVPECL LVDS LVDS FIR0 FIR4 5 taps 59 taps LVDS DAC3282 SLAS646A – DECEMBER 2009 – REVISED FEBRUARY 2010 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FUNCTIONAL BLOCK DIAGRAM 2 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated Product Folder Link(s): DAC3282 |
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