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DAC5681IRGCT Arkusz danych(PDF) 8 Page - Texas Instruments |
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DAC5681IRGCT Arkusz danych(HTML) 8 Page - Texas Instruments |
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8 / 47 page  ELECTRICAL CHARACTERISTICS — AC SPECIFICATION (1) DAC5681 SLLS864A – AUGUST 2007 – REVISED JANUARY 2009 ................................................................................................................................................. www.ti.com Over recommended operating free-air temperature range, AVDD, IOVDD = 3.3 V, CLKVDD, DVDD = 1.8 V, IOUTFS = 20 mA, 4:1 transformer output termination, 50 Ω doubly terminated load (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT ANALOG OUTPUT fCLK Maximum output update rate 1000 MSPS ts(DAC) Output settling time to 0.1% Transition: Code 0x0000 to 0xFFFF 10.4 ns DAC output is updated on falling edge of DAC clock. tpd Output propagation delay 2.5 ns Does not include Digital Latency (see below). tr(IOUT) Output rise time 10% to 90% 220 ps tf(IOUT) Output fall time 90% to 10% 220 ps DAC Digital Latency 76 clock cycles BiasLPF_A enabled; register 0x06, Bit 3 set to 1. 8 µs DAC Wake-up Time(2) BiasLPF_A disabled; register 0x06, Bit 3 set to 0. 80 µs Power-up Time BiasLPF_A enabled; register 0x06, Bit 3 set to 1. 8 µs DAC Sleep Time (3) BiasLPF_A disabled; register 0x06, Bit 3 set to 0. 80 µs AC PERFORMANCE CLKIN = 500 MHz, IF = 5.1 MHz, 81 First Nyquist Zone < fDATA/2 CLKIN = 1000 MHz, IF = 5.1 MHz, SFDR Spurious free dynamic range 80 dBc First Nyquist Zone < fDATA/2 CLKIN = 1000 MHz, IF = 20.1 MHz, 77 First Nyquist Zone < fDATA/2 CLKIN = 500 MHZ, Single tone, 0 dBFS, 75 IF = 20.1 MHz CLKIN = 1000 MHZ, Single tone, 0 dBFS, 70 IF = 20.1 MHz CLKIN = 1000 MHZ, Single tone, 0 dBFS, 66 IF = 70.1 MHz SNR Signal-to-noise ratio dBc CLKIN = 1000 MHZ, Single tone, 0 dBFS, 60 IF = 180 MHz CLKIN = 1000 MHZ, Single tone, 0 dBFS, 60 IF = 300.2 MHz CLKIN = 1000 MHZ, Four tone, each -12 dBFS, 73 IF = 24.7, 24.9, 25.1 and 25.3 MHz CLKIN = 1000 MHZ, IF = 20.1 and 21.1 MHz 88 Third-order two-tone IMD3 intermodulation CLKIN = 1000 MHZ, IF = 70.1 and 71.1 MHz 75 dBc (each tone at –6 dBFS) CLKIN = 1000 MHZ, IF = 150.1 and 151.1 MHz 67 Four-tone intermodulation IMD CLKIN = 1000 MHz, IF = 298.4, 299.2, 300.8 and 301.6 MHz 64 dBc (each tone at –12 dBFS) Single carrier, baseband, CLKIN = 983.04 MHz 80 83 Single carrier, IF = 180 MHz, CLKIN = 983.04 MHz 73 ACLR(4) Adjacent channel leakage ratio dBc Four carrier, IF = 180 MHz, CLKIN = 983.04 MHz 68 Four carrier, IF = 275 MHz, CLKIN = 983.04 MHz 66 50-MHz offset, 1-MHz BW, Single Carrier, baseband, 93 CLKIN = 983.04 Noise floor(5) dBc 50-MHz offset, 1-MHz BW, Four Carrier, baseband, 85 CLKIN = 983.04 (1) Measured single-ended into 50 Ω load. (2) IOUT current settling to 1% of IOUTFS. Measured from SDENB rising edge; Register 0x06, toggle Bit 4 from 1 to 0. (3) IOUT current settling to less than 1% of IOUTFS. Measured from SDENB rising edge; Register 0x06, toggle Bit 4 from 0 to 1. (4) W-CDMA with 3.84 MHz BW, 5-MHz spacing, centered at IF. TESTMODEL 1, 10 ms (5) Carrier power measured in 3.84 MHz BW. 8 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): DAC5681 |
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