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BA8522RFVM Arkusz danych(PDF) 4 Page - Rohm

Numer części BA8522RFVM
Szczegółowy opis  LOW OFFSET VOLTAGE DUAL OPERATIONAL AMPLIFIERS
Download  5 Pages
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Producent  ROHM [Rohm]
Strona internetowa  http://www.rohm.com
Logo ROHM - Rohm

BA8522RFVM Arkusz danych(HTML) 4 Page - Rohm

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REV. B
(6) Short circuits between pins and incorrect mounting
Short circuits between pins and incorrect mounting when mounting the IC on a printed circuits board,
take notice of the direction and positioning of the IC.
If IC is mounted erroneously, It may be damaged. Also, when a foreign object is inserted between
output, between output and VCC terminal or VEE terminal which causes short circuit, the IC may be damaged.
(7) Using under strong electromagnetic field
Be careful when using the IC under strong electromagnetic field because it may malfunction.
(8) Usage of IC
When stress is applied to the IC through warp of the printed circuit board,
The characteristics may fluctuate due to the piezo effect.
Be careful of the warp of the printed circuit board.
(9) Testing IC on the set board
When testing IC on the set board, in cases where the capacitor is connected to the low impedance,
make sure to discharge per fabrication because there is a possibility that IC may be damaged by stress.
When removing IC from the set board, it is essential to cut supply voltage.
As a countermeasure against the static electricity, observe proper grounding during fabrication process
and take due care when carrying and storage it.
(10) The IC destruction caused by capacitive load
The transistors in circuits may be damaged when VCC terminal and VEE terminal is shorted with the charged
output terminal capacitor.
When IC is used as a comparator or as application circuits no constructed negative feed back,
where oscillation is not activated by an output capacitor, the output capacitor must be kept below
0.1[μF] in order to prevent the damage mentioned above.
(11) The oscillation caused by capacitive load
Designed negative feedback circuit using this IC, verify output oscillation caused by capacitive load.


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