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CAT24C208 Arkusz danych(PDF) 2 Page - ON Semiconductor |
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CAT24C208 Arkusz danych(HTML) 2 Page - ON Semiconductor |
2 / 10 page CAT24C208 http://onsemi.com 2 Table 1. PIN DESCRIPTION Pin Number Pin Name Function 1 DSP VCC Device power from display controller 2 DSP SCL The CAT24C208 DSP serial clock bidirectional pin is used to clock all data transfers into or out of the device DSP SDA pin and is also used to block DSP Port access when DDC Port is active. 3 DSP SDA DSP Serial Data/Address. The bidirectional DSP serial data/address pin is used to transfer data into and out of the device from a display controller. The DSP SDA pin is an open drain output and can be wireOR’ed with other open drain or open collector outputs. 4 VSS Device ground. 5 DDC SDA DDC Serial Data/Address. The bidirectional DDC serial data/address pin is used to transfer data into and out of the device from a DDC host. The DDC SDA pin is an open drain output and can be wire− OR’ed with other open drain or open collector outputs. 6 DDC SCL The CAT24C208 DDC serial clock bidirectional pin is used to clock all data transfers into or out of the device DDC SDA pin, and is used to block DDC Port for access when DSP Port is active. 7 EDID SEL EDID select. The CAT24C208 EDID select input selects the active bank of memory to be accessed via the DDC SDA/SCL interface as set in the configuration register. 8 DDC VCC Device power when powered from a DDC host. Table 2. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Temperature Under Bias –55 to +125 °C Storage Temperature –65 to +150 °C Voltage on Any Pin with Respect to Ground (Note 1) –2.0 to +VCC +2.0 V VCC with Respect to Ground –2.0 to +7.0 V Package Power Dissipation Capability (TA = 25°C) 1.0 W Lead Soldering Temperature (10 secs) 300 °C Output Short Circuit Current (Note 2) 100 mA Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. The minimum DC input voltage is –0.5 V. During transitions, inputs may undershoot to –2.0 V for periods of less than 20 ns. Maximum DC voltage on output pins is VCC + 0.5 V, which may overshoot to VCC + 2.0 V for periods of less than 20 ns. 2. Output shorted for no more than one second. No more than one output shorted at a time. Table 3. RELIABILITY CHARACTERISTICS Symbol Parameter Reference Test Method Min Units NEND (Note 3) Endurance MIL−STD−883, Test Method 1033 1,000,000 Cycles/Byte TDR (Note 3) Data Retention MIL−STD−883, Test Method 1008 100 Years VZAP (Note 3) ESD Susceptibility JEDEC Standard JESD 22 2000 Volts ILTH (Notes 3 and 4) Latch−up JEDEC Standard 17 100 mA 3. This parameter is tested initially and after a design or process change that affects the parameter. 4. Latch−up protection is provided for stresses up to 100 mA on address and data pins from –1 V to VCC +1 V. Table 4. CAPACITANCE (TA = 25°C, f = 1.0 MHz, VCC = 5 V) Symbol Parameter Conditions Min Typ Max Units CI/O (Note 5) Input/Output Capacitance (Either DSP or DDC SDA) VI/O = 0 V 8 pF CIN (Note 5) Input Capacitance (EDID, Either DSP or DDC SCL) VIN = 0 V 6 pF 5. This parameter is tested initially and after a design or process change that affects the parameter. |
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