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CAT28C17AWA-20T Arkusz danych(PDF) 4 Page - ON Semiconductor |
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CAT28C17AWA-20T Arkusz danych(HTML) 4 Page - ON Semiconductor |
4 / 12 page CAT28C17A http://onsemi.com 4 Table 4. RELIABILITY CHARACTERISTICS (Note 4) Symbol Parameter Test Method Min Max Units NEND Endurance MIL−STD−883, Test Method 1033 10,000 Cycles/Byte TDR Data Retention MIL−STD−883, Test Method 1008 10 Years VZAP ESD Susceptibility MIL−STD−883, Test Method 3015 2,000 V ILTH (Note 5) Latch−Up JEDEC Standard 17 100 mA 4. This parameter is tested initially and after a design or process change that affects the parameter. 5. Latch−up protection is provided for stresses up to 100 mA on address and data pins from −1 V to VCC + 1 V. Table 5. D.C. OPERATING CHARACTERISTICS (VCC = 5 V ±10%, unless otherwise specified.) Symbol Parameter Test Conditions Limits Units Min Typ Max ICC VCC Current (Operating, TTL) CE = OE = VIL, f = 1/tRC min, All I/O’s Open 35 mA ICCC (Note 6) VCC Current (Operating, CMOS) CE = OE = VILC, f = 1/tRC min, All I/O’s Open 25 mA ISB VCC Current (Standby, TTL) CE = VIH, All I/O’s Open 1 mA ISBC (Note 7) VCC Current (Standby, CMOS) CE = VIHC, All I/O’s Open 100 mA ILI Input Leakage Current VIN = GND to VCC −10 10 mA ILO Output Leakage Current VOUT = GND to VCC, CE = VIH −10 10 mA VIH (Note 7) High Level Input Voltage 2 VCC + 0.3 V VIL (Note 6) Low Level Input Voltage −0.3 0.8 V VOH High Level Output Voltage IOH = −400 mA 2.4 V VOL Low Level Output Voltage IOL = 2.1 mA 0.4 V VWI Write Inhibit Voltage 3.0 V 6. VILC = −0.3 V to +0.3 V 7. VIHC = VCC −0.3 V to VCC + 0.3 V Table 6. A.C. CHARACTERISTICS, READ CYCLE (VCC = 5 V ±10%, unless otherwise specified.) Symbol Parameter 28C17A−20 Units Min Max tRC Read Cycle Time 200 ns tCE CE Access Time 200 ns tAA Address Access Time 200 ns tOE OE Access Time 80 ns tLZ (Note 8) CE Low to Active Output 0 ns tOLZ (Note 8) OE Low to Active Output 0 ns tHZ (Notes 8, 9) CE High to High−Z Output 55 ns tOHZ (Notes 8, 9) OE High to High−Z Output 55 ns tOH (Note 8) Output Hold from Address Change 0 ns 8. This parameter is tested initially and after a design or process change that affects the parameter. 9. Output floating (High−Z) is defined as the state when the external data line is no longer driven by the output buffer. |
Podobny numer części - CAT28C17AWA-20T |
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Podobny opis - CAT28C17AWA-20T |
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