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CAT140049TWI-GT3 Arkusz danych(PDF) 2 Page - ON Semiconductor

Numer części CAT140049TWI-GT3
Szczegółowy opis  Voltage Supervisor with I2C Serial CMOS EEPROM
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CAT140xx
Doc. No. MD-1117 Rev. B
2
© 2008 SCILLC. All rights reserved.
Characteristics subject to change without notice
BLOCK DIAGRAM
ABSOLUTE MAXIMUM RATINGS
(1)
Parameters
Ratings
Units
Storage Temperature
-65 to +150
°C
Voltage on Any Pin with Respect to Ground
(2)
-0.5 to +6.5
V
RELIABILITY CHARACTERISTICS
(3)
Symbol
Parameter
Min
Units
NEND
(4)
Endurance
1,000,000
Program/ Erase Cycles
TDR
Data Retention
100
Years
D.C. OPERATING CHARACTERISTICS
VCC = +2.5V to +5.5V unless otherwise specified.
Limits
Symbol
Parameter
Min.
Typ.
Max.
Test Condition
Units
ICC
Supply Current
1
Read or Write at 400kHz
mA
10
22
VCC < 5.5V; All I/O Pins at VSS or VCC
ISB
Standby Current
8
17
VCC < 3.6V; All I/O Pins at VSS or VCC
μA
IL
I/O Pin Leakage
2
Pin at GND or VCC
μA
VIL
Input Low Voltage
-0.5
VCC x 0.3
V
VIH
Input High Voltage
VCC x 0.7
VCC + 0.5
V
VOL
Output Low Voltage
SDA
0.4
VCC 2.5 V, IOL = 3.0 mA
V
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The DC input voltage on any pin should not be lower than -0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than -1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns.
(3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100
and JEDEC test methods.
(4) Page Mode, VCC = 5 V, 25°C
SDA
EEPROM
SCL
A0
A1
A2
VCC
VOLTAGE
DETECTOR
RST or RST
VSS


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