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ADS1196 Arkusz danych(PDF) 2 Page - Texas Instruments |
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ADS1196 Arkusz danych(HTML) 2 Page - Texas Instruments |
2 / 73 page ADS1194 ADS1196 ADS1198 SBAS471A – APRIL 2010 – REVISED SEPTEMBER 2010 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FAMILY AND ORDERING INFORMATION(1) OPERATING NUMBER OF MAXIMUM SAMPLE TEMPERATURE PRODUCT PACKAGE OPTION CHANNELS ADC RESOLUTION RATE (kSPS) RANGE BGA 4 16 8 0°C to +70°C ADS1194 TQFP 4 16 8 0°C to +70°C BGA 6 16 8 0°C to +70°C ADS1196 TQFP 6 16 8 0°C to +70°C BGA 8 16 8 0°C to +70°C ADS1198 TQFP 8 16 8 0°C to +70°C ADS1294 BGA 4 24 32 0°C to +70°C ADS1294I TQFP 4 24 32 –40°C to +85°C ADS1296 BGA 6 24 32 0°C to +70°C ADS1296I TQFP 6 24 32 –40°C to +85°C ADS1298 BGA 8 24 32 0°C to +70°C ADS1298I TQFP 8 24 32 –40°C to +85°C (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the device product folder at www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range, unless otherwise noted. ADS1194, ADS1196, ADS1198 UNIT AVDD to AVSS –0.3 to +5.5 V DVDD to DGND –0.3 to +3.9 V AVSS to DGND –3 to +0.2 V VREF input to AVSS AVSS – 0.3 to AVDD + 0.3 V Analog input to AVSS AVSS – 0.3 to AVDD + 0.3 V Digital input voltage to DGND –0.3 to DVDD + 0.3 V Digital output voltage to DGND –0.3 to DVDD + 0.3 V Digital input voltage to DGND –0.3 to DVDD + 0.3 V Digital output voltage to DGND –0.3 to DVDD + 0.3 V Input current (momentary) 100 mA Input current (continuous) 10 mA Operating temperature ADS1194, ADS1196, ADS1198 0 to +70 °C range Human body model (HBM) ±2000 V JEDEC standard 22, test method A114-C.01, all pins ESD ratings Charged device model (CDM) ±500 V JEDEC standard 22, test method C101, all pins Storage temperature range –60 to +150 °C Maximum junction temperature (TJ) +150 °C (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. 2 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): ADS1194 ADS1196 ADS1198 |
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