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74AHC377 Arkusz danych(PDF) 11 Page - NXP Semiconductors

Numer części 74AHC377
Szczegółowy opis  Octal D-type flip-flop with data enable; positive-edge trigger
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Producent  NXP [NXP Semiconductors]
Strona internetowa  http://www.nxp.com
Logo NXP - NXP Semiconductors

74AHC377 Arkusz danych(HTML) 11 Page - NXP Semiconductors

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74AHC_AHCT377_2
© NXP B.V. 2008. All rights reserved.
Product data sheet
Rev. 02 — 12 June 2008
11 of 16
NXP Semiconductors
74AHC377; 74AHCT377
Octal D-type flip-flop with data enable; positive-edge trigger
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Fig 8.
Load circuitry for measuring switching times
001aah768
tW
tW
tr
tr
tf
VM
VI
negative
pulse
GND
VI
positive
pulse
GND
10 %
90 %
90 %
10 %
VM
VM
VM
tf
VCC
DUT
RT
VI
VO
CL
G
Table 9.
Test data
Type
Input
Load
Test
VI
tr, tf
CL
74AHC377
VCC
≤ 3.0 ns
15 pF, 50 pF
tPLH, tPHL
74AHCT377
3.0 V
≤ 3.0 ns
15 pF, 50 pF
tPLH, tPHL


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