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74AHC377 Arkusz danych(PDF) 11 Page - NXP Semiconductors |
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74AHC377 Arkusz danych(HTML) 11 Page - NXP Semiconductors |
11 / 16 page 74AHC_AHCT377_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 12 June 2008 11 of 16 NXP Semiconductors 74AHC377; 74AHCT377 Octal D-type flip-flop with data enable; positive-edge trigger Test data is given in Table 9. Definitions test circuit: RT = termination resistance should be equal to output impedance Zo of the pulse generator. CL = load capacitance including jig and probe capacitance. Fig 8. Load circuitry for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 9. Test data Type Input Load Test VI tr, tf CL 74AHC377 VCC ≤ 3.0 ns 15 pF, 50 pF tPLH, tPHL 74AHCT377 3.0 V ≤ 3.0 ns 15 pF, 50 pF tPLH, tPHL |
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