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LC89962M Arkusz danych(PDF) 3 Page - Sanyo Semicon Device |
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LC89962M Arkusz danych(HTML) 3 Page - Sanyo Semicon Device |
3 / 6 page 4. Measure the differential gain (DG) and differential phase (DP) using a vector scope with a 5-step function wave input. (See the following figure.) 5. To measure LS, input a 5-step function wave and measure the ratio of the sync level (S) to the luminance level (Y). S [mV] LS = ———— × 100 [%] Y [mV] 6. To measure clock leakage (Lck), measure the 4fsc (14.3 MHz) component in the output signal with a spectrum analyzer when no input signal is presented. 7. To measure the noise level (NO), measure the noise output in the OUT pin output when no input signal is present with a video noise meter. Set up the noise meter with a 200-kHz high-pass filter, a 4.2-MHz low-pass filter, and 3.58-MHz trap filter. 8. The following formula is used to calculate the output impedance (ZO). V1 [mVp-p] – V2 [mVp-p] ZO = ——————————— × 500 [Ω] V2 [mVp-p] 9. To measure the delay time (TD), measure the delay time of the output signal to the input signal. In this measurement, the delay time associated with the low-pass filter must be excluded. No. 5420-3/6 LC89962, LC89962M Output signal symbol SW3 Input signal V1 a Sine wave: 200 kHz, 500 mV p-p V2 b |
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