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AD9434-370EBZ Arkusz danych(PDF) 4 Page - Analog Devices

Numer części AD9434-370EBZ
Szczegółowy opis  12-Bit, 370 MSPS/500 MSPS, 1.8 V Analog-to-Digital Converter
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Producent  AD [Analog Devices]
Strona internetowa  http://www.analog.com
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AD9434-370EBZ Arkusz danych(HTML) 4 Page - Analog Devices

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AD9434
Rev. A | Page 4 of 28
AC SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, TMIN = −40°C, TMAX = +85°C, fIN = −1.0 dBFS, full scale = 1.5 V, unless otherwise noted.
Table 2.
AD9434-370
AD9434-500
Parameter1, 2
Temp
Min
Typ
Max
Min
Typ
Max
Unit
SNR
fIN = 30.3 MHz
25°C
66.3
65.9
dBFS
fIN = 70.3 MHz
25°C
66.2
65.9
dBFS
fIN = 100.3 MHz
25°C
66.1
65.8
dBFS
Full
65.3
64.5
dBFS
fIN = 250.3 MHz
25°C
65.5
65.2
dBFS
fIN = 450.3 MHz
25°C
64.0
63.5
dBFS
SINAD
fIN = 30.3 MHz
25°C
66.1
65.9
dBFS
fIN = 70.3 MHz
25°C
66.1
65.8
dBFS
fIN = 100.3 MHz
25°C
66.0
65.8
dBFS
Full
65.2
64.4
dBFS
fIN = 250.3 MHz
25°C
65.3
64.8
dBFS
fIN = 450.3 MHz
25°C
63.7
62.9
dBFS
EFFECTIVE NUMBER OF BITS (ENOB)
fIN = 30.3 MHz
25°C
10.7
10.7
Bits
fIN = 70.3 MHz
25°C
10.7
10.6
Bits
fIN = 100.3 MHz
25°C
10.7
10.6
Bits
fIN = 250.3 MHz
25°C
10.6
10.5
Bits
fIN = 450.3 MHz
25°C
10.3
10.2
Bits
WORST HARMONIC (SECOND or THIRD)
fIN = 30.3 MHz
25°C
−93
−93
dBc
fIN = 70.3 MHz
25°C
−89
−91
dBc
fIN = 100.3 MHz
25°C
−83
−87
dBc
Full
−75
−74
dBc
fIN = 250.3 MHz
25°C
−80
−78
dBc
fIN = 450.3 MHz
25°C
−78
−69
dBc
SFDR
fIN = 30.3 MHz
25°C
89
84
dBc
fIN = 70.3 MHz
25°C
88
82
dBc
fIN = 100.3 MHz
25°C
83
83
dBc
Full
75
74
dBc
fIN = 250.3 MHz
25°C
79
78
dBc
fIN = 450.3 MHz
25°C
78
68
dBc
WORST OTHER HARMONIC (SFDR EXCLUDING SECOND and THIRD)
fIN = 30.3 MHz
25°C
−90
−85
dBc
fIN = 70.3 MHz
25°C
−90
−82
dBc
fIN = 100.3 MHz
25°C
−91
−84
dBc
Full
−75
−74
dBc
fIN = 250.3 MHz
25°C
−83
−85
dBc
fIN = 450.3 MHz
25°C
−82
−78
dBc
TWO-TONE IMD
fIN1 = 119.5 MHz, fIN2 = 122.5 MHz
25°C
−85
−85
dBc
ANALOG INPUT BANDWIDTH
Full Power
25°C
1
1
GHz
1 All ac specifications tested by driving CLK+ and CLK− differentially.
2 See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for a complete set of definitions and how these tests were completed.


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