Zakładka z wyszukiwarką danych komponentów |
|
ADXRS646BBGZ Arkusz danych(PDF) 10 Page - Analog Devices |
|
ADXRS646BBGZ Arkusz danych(HTML) 10 Page - Analog Devices |
10 / 12 page ADXRS646 Data Sheet Rev. 0 | Page 10 of 12 SUPPLY RATIOMETRICITY The null output voltage (RATEOUT), sensitivity, self-test responses (ST1 and ST2), and temperature output (TEMP) of the ADXRS646 are ratiometric to VRATIO. Therefore, using the ADXRS646 with a supply-ratiometric ADC results in self- cancellation of errors resulting from minor supply variations. There remains a small, usually negligible, error due to non- ratiometric behavior. Note that, to guarantee full measurement range, VRATIO should not be greater than AVCC. NULL ADJUSTMENT The nominal 3.0 V null output voltage is true for a symmetrical swing range at RATEOUT (1B, 2A). However, an asymmetric output swing may be suitable in some applications. Null adjust- ment is possible by injecting a suitable current to SUMJ (1C, 2C). Note that supply disturbances may cause some null instability. Digital supply noise should be avoided, particularly in this case. SELF-TEST FUNCTION The ADXRS646 includes a self-test feature that actuates each of the sensing structures and associated electronics in the same manner as if the gyroscope were subjected to angular rate. Self-test is activated by applying the standard logic high level ST1 pin (5F, 5G), the ST2 pin (4F, 4G), or both. Applying a logic high to Pin ST1 causes the voltage at RATEOUT to change by −450 mV (typical), and applying a logic high to Pin ST2 causes an opposite change of +450 mV (typical). The voltage applied to the ST1 and ST2 pins must never be greater than AVCC. The self-test response follows the temperature dependence of the viscosity of the package atmosphere, approximately 0.25%/°C. Activating both ST1 and ST2 simultaneously is not damaging. The output responses generated by ST1 and ST2 are closely matched (±2%), but actuating both simultaneously may result in a small apparent null bias shift proportional to the degree of self-test mismatch. CONTINUOUS SELF-TEST The on-chip integration of the ADXRS646, as well as the mature process with which it is manufactured, have provided the gyroscope with field-proven reliability. As an additional failure detection measure, self-test can be performed at power-up or occasionally during operation. However, some applications may require continuous self-test while sensing rotation rate. Details outlining continuous self-test techniques are available in the AN-768 Application Note, Using the ADXRS150/ADXRS300 in Continuous Self-Test Mode. Although the title of this application note refers to other Analog Devices gyroscopes, the techniques apply equally to the ADXRS646. MODIFYING THE MEASUREMENT RANGE The ADXRS646 scale factor can be reduced to extend the measurement range to as much as ±450°/sec by adding a single 225 kΩ resistor between RATEOUT and SUMJ. If an external resistor is added between RATEOUT and SUMJ, COUT must be proportionally increased to maintain correct bandwidth. |
Podobny numer części - ADXRS646BBGZ |
|
Podobny opis - ADXRS646BBGZ |
|
|
Link URL |
Polityka prywatności |
ALLDATASHEET.PL |
Czy Alldatasheet okazała się pomocna? [ DONATE ] |
O Alldatasheet | Reklama | Kontakt | Polityka prywatności | Linki | Lista producentów All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |