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ADP1046ACPZ-R7 Arkusz danych(PDF) 9 Page - Analog Devices |
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ADP1046ACPZ-R7 Arkusz danych(HTML) 9 Page - Analog Devices |
9 / 96 page Data Sheet ADP1046 Rev. 0 | Page 9 of 96 Parameter Symbol Test Conditions/Comments Min Typ Max Unit EEPROM RELIABILITY Endurance1 TJ = 85°C 10,000 Cycles TJ = 125°C 1000 Cycles Data Retention2 TJ = 85°C 20 Years TJ = 125°C 10 Years 1 Endurance is qualified as per JEDEC Standard 22, Method A117, and is measured at −40°C, +25°C, +85°C, and +125°C. Endurance conditions are subject to change pending EEPROM qualification. 2 Retention lifetime equivalent at junction temperature (TJ) = 85°C as per JEDEC Standard 22, Method A117. The derated retention lifetime equivalent at junction temperature TJ = 125°C is 2.87 years and is subject to change pending EEPROM qualification. Timing Diagram SCL SDA PS tBUF tHD;STA tHD;DAT tHIGH tSU;DAT tHD;STA tSU;STA tSU;STO tLOW tR tF SP Figure 3. Serial Bus Timing Diagram |
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