CY74FCT163374

CY74FCT163H374

2

(Above which the useful life may be impaired. For user

guidelines, not tested.)

Storage Temperature

.....................................−55°C to +125°C

Ambient Temperature with

Power Applied

..................................................−55°C to +125°C

Supply Voltage Range ..................................... 0.5V to +4.6V

DC Input Voltage

.................................................−0.5V to +7.0V

DC Output Voltage

..............................................−0.5V to +7.0V

DC Output Current

(Maximum Sink Current/Pin)

...........................−60 to +120 mA

Power Dissipation .......................................................... 1.0W

Inputs

Outputs

Function

D

CLK

OE

O

X

L

H

Z

High-Z

X

H

H

Z

L

L

L

Load

Register

H

L

H

L

H

Z

H

H

Z

Pin Description

Name

Description

D

CLK

Clock Inputs

OE

Three-State Output Enable Inputs (Active LOW)

O

Three-State Outputs

Operating Range

Range

Ambient

Temperature

Industrial

−40°C to +85°C

2.7V to 3.6V

Parameter

Description

Test Conditions

Min.

Max.

Unit

Input HIGH Voltage

All Inputs

2.0

5.5

V

Input LOW Voltage

0.8

V

100

mV

Input Clamp Diode Voltage

–0.7

–1.2

V

Input HIGH Current

±1

µA

Input LOW Current

±1

µA

High Impedance Output Current

(Three-State Output pins)

±1

µA

High Impedance Output Current

(Three-State Output pins)

±1

µA

–60

–135

–240

mA

Power-Off Disable

±100

µA

Quiescent Power Supply Current

0.1

10

µA

∆I

CC

Quiescent Power Supply Current

(TTL inputs HIGH)

[8]

2.0

30

µA

Notes:

1.

H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = HIGH Impedance.

= LOW-to-HIGH Transition.

2.

On the CY74FCT163H374, these pins have “bus hold.”

3.

Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature

range.

4.

5.

6.

This parameter is specified but not tested.

7.

Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample

and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of

a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter

8.