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ULN2004AFWG Arkusz danych(PDF) 3 Page - Toshiba Semiconductor |
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ULN2004AFWG Arkusz danych(HTML) 3 Page - Toshiba Semiconductor |
3 / 13 page ULN2003,04APG/AFWG 2010-12-03 3 Recommended Operating Conditions (Ta = −40 to 85°C) Characteristic Symbol Test Condition Min Typ. Max Unit Output sustaining voltage VCE (SUS) ⎯ 0 ⎯ 50 V Duty = 10% 0 ⎯ 350 APG Duty = 50% 0 ⎯ 100 Duty = 10% 0 ⎯ 300 Output current AFWG IOUT tpw = 25 ms 7 Circuits Ta = 85°C Tj = 120°C Duty = 50% 0 ⎯ 90 mA/ch Input voltage VIN ⎯ 0 ⎯ 24 V ULN2003A 2.8 ⎯ 24 Input voltage (output on) ULN2004A VIN (ON) IOUT = 400 mA hFE = 800 6.2 ⎯ 24 V ULN2003A ⎯ 0 ⎯ 0.7 Input voltage (output off) ULN2004A VIN (OFF) ⎯ 0 ⎯ 1.0 V Clamp diode reverse voltage VR ⎯ ⎯ ⎯ 50 V Clamp diode forward current IF ⎯ ⎯ ⎯ 350 mA APG Ta = 85°C ⎯ ⎯ 0.76 Power dissipation AFWG PD Ta = 85°C (Note) ⎯ ⎯ 0.65 W Note: On PCB (Test Board: JEDEC 2s2p) |
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