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AD871SD Arkusz danych(PDF) 6 Page - Analog Devices |
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AD871SD Arkusz danych(HTML) 6 Page - Analog Devices |
6 / 16 page AD871 REV. A –6– OVERVOLTAGE RECOVERY TIME Overvoltage recovery time is defined as that amount of time required for the ADC to achieve a specified accuracy after an overvoltage (50% greater than full-scale range), measured from the time the overvoltage signal reenters the converter’s range. DYNAMIC SPECIFICATIONS SIGNAL-TO-NOISE AND DISTORTION (S/N+D) RATIO S/N+D is the ratio of the rms value of the measured input signal to the rms sum of all other spectral components below the Nyquist frequency, including harmonics but excluding dc. The value for S/N+D is expressed in decibels. TOTAL HARMONIC DISTORTION (THD) THD is the ratio of the rms sum of the first six harmonic com- ponents to the rms value of the measured input signal and is expressed as a percentage or in decibels. INTERMODULATION DISTORTION (IMD) With inputs consisting of sine waves at two frequencies, fa and fb, any device with nonlinearities will create distortion products, of order (m + n), at sum and difference frequencies of mfa ± nfb, where m, n = 0, 1, 2, 3 . . . . Intermodulation terms are those for which m or n is not equal to zero. For example, the second order terms are (fa + fb) and (fa – fb), and the third or- der terms are (2 fa + fb), (2 fa – fb), (fa + 2 fb) and (2 fb – fa). The IMD products are expressed as the decibel ratio of the rms sum of the measured input signals to the rms sum of the distor- tion terms. The two signals are of equal amplitude and the peak value of their sums is –0.5 dB from full scale. The IMD prod- ucts are normalized to a 0 dB input signal. FULL-POWER BANDWIDTH The full-power bandwidth is that input frequency at which the amplitude of the reconstructed fundamental is reduced by 3 dB for a full-scale input. SPURIOUS FREE DYNAMIC RANGE The difference, in dB, between the rms amplitude of the input signal and the peak spurious signal. ORDERING GUIDE Model Temperature Range Package Option 1 AD871JD 0 °C to +70°C D-28 AD871JE 0 °C to +70°C E-44A AD871SD 2 –55 °C to +125°C D-28 AD871SE 2 –55 °C to +125°C E-44A NOTES 1D = Side Brazed Ceramic DIP, E = Leadless Ceramic Chip Carrier. 2MIL-STD-883 version will be available; contact factory. DEFINITIONS OF SPECIFICATIONS LINEARITY ERROR Linearity error refers to the deviation of each individual code from a line drawn from “negative full scale” through “positive full scale.” The point used as “negative full scale” occurs 1/2 LSB before the first code transition. “Positive full scale” is defined as a level 1 1/2 LSB beyond the last code transition. The deviation is measured from the middle of each particular code to the true straight line. DIFFERENTIAL LINEARITY ERROR (DNL, NO MISSING CODES) An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal value. Guaranteed no missing codes to 12-bit resolution indicates that all 4096 codes must be present over all operating ranges. ZERO ERROR The major carry transition should occur for an analog value 1/2 LSB below analog common. Zero error is defined as the devia- tion of the actual transition from that point. The zero error and temperature drift specify the initial deviation and maximum change in the zero error over temperature. GAIN ERROR The first code transition should occur for an analog value 1/2 LSB above nominal negative full scale. The last transition should occur for an analog value 1 1/2 LSB below the nominal positive full scale. Gain error is the deviation of the actual dif- ference between first and last code transitions and the ideal dif- ference between first and last code transitions. TEMPERATURE DRIFT The temperature drift for zero error and gain error specifies the maximum change from the initial (25 °C) value to the value at TMIN or TMAX. POWER SUPPLY REJECTION The specifications show the maximum change in the converter’s full-scale as the supplies are varied from nominal to min/max values. APERTURE JITTER Aperture jitter is the variation in aperture delay for successive samples and is manifested as noise on the input to the A/D. APERTURE DELAY Aperture delay is a measure of the Track-and-Hold Amplifier (THA) performance and is measured from the rising edge of the clock input to when the input signal is held for conversion. |
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