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ADMCF340BST Arkusz danych(PDF) 2 Page - Analog Devices |
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ADMCF340BST Arkusz danych(HTML) 2 Page - Analog Devices |
2 / 40 page REV. 0 –2– ADMCF340 (VDD = 5%, GND = 0 V, TA = –40 C to +85 C, CLKIN = 10 MHz, unless otherwise noted.) ANALOG-TO-DIGITAL CONVERTER Parameter Min Typ Max Unit Conditions/Comments Signal Input 0.3 3.5 V VAUX0, VAUX1, VAUX2 Resolution 1 12 Bits Linearity Error2 3 4 Bits Zero Offset 3 –32 0 +7 mV Comparator Delay 600 ns ADC High Level Input Current2 10 µAV IN = 3.5 V ADC Low Level Input Current 2 –10 µAVIN = 0.0 V NOTES 1Resolution varies with PWM switching frequency (double update mode) 78.1 kHz = 8 bits, 4.9 kHz = 12 bits. 22.44 kHz sample frequency, VAUX0, VAUX1, VAUX2 3Extrapolated point outside of operating range. 2.44 kHz sample frequency Specifications subject to change without notice. ISENSE AMPLIFIER–TRIP Parameter Min Typ Max Unit Conditions/Comments ISENSE Signal Operating Range –400 +400 mV ISENSE Gain –2.6 –2.51 –2.34 % VIN = –400 mV to +400 mV ISENSE Gain Channel Matching 5.5 % VIN = –400 mV to +400 mV ISENSE Gain Stability 1 0.8 % VIN = –400 mV to +400 mV ISENSE Linearity 2 89 Bits ISENSE Internal Offset Voltage 2 1.68 1.87 2.1 V ISENSE Internal Offset Stability 2 2.1 % ISENSE Signal-to-Noise Ratio (SNR) 3 51 dB ISENSE Signal-to-Noise Ratio Less Distortion 54 dB (SNR) 3 –40 dB ISENSE Total Harmonic Distortion 3 –53 dB ISENSE Input Current –200 +10 µAV IN = –400 mV to +400 mV ISENSE Input Resistance 11.5 k Ω TRIP Threshold Low –690 –430 mV TRIP Threshold High 430 690 mV TRIP Minimum Pulsewidth 4 5 µs NOTES 1Variation of gain with V DD and temperature 2V IN = –400 mV to +400 mV. 3f IN = 1 kHz sine wave, VIN = –400 mV to +400 mV, fS = 4 kHz. 4High or low trip threshold CURRENT SOURCE1 Parameter Min Typ Max Unit Conditions/Comments Programming Resolution 3 Bits Tuned Current 2 91 100 109 µA NOTES 1For ADC calibration 20.3 V to 3.5 V I CONST voltage |
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