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ADXL313 Datasheet(Arkusz danych) 3 Page - Analog Devices

Numer części ADXL313
Szczegółowy opis  3-Axis, ±0.5 g/±1 g/±2 g/±4 g Digital Accelerometer
Pobierz  28 Pages
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Producent  AD [Analog Devices]
Strona internetowa  http://www.analog.com
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Data Sheet
ADXL313
Rev. 0 | Page 3 of 28
SPECIFICATIONS
TA = −40°C to +105°C, VS = VDD I/O = 3.3 V, acceleration = 0 g, unless otherwise noted.
Table 1.
Parameter1
Test Conditions/Comments
Min
Typ
Max
Unit
SENSOR INPUT
Each axis
Measurement Range
User selectable
±0.5, ±1, ±2, ±4
g
Nonlinearity
Percentage of full scale
±0.5
%
Micro-Nonlinearity
Measured over any 50 mg interval
±2
%
Interaxis Alignment Error
±0.1
Degrees
Cross-Axis Sensitivity2
±1
%
OUTPUT RESOLUTION
Each axis
All g Ranges
Default resolution
10
Bits
±0.5 g Range
Full resolution enabled
10
Bits
±1 g Range
Full resolution enabled
11
Bits
±2 g Range
Full resolution enabled
12
Bits
±4 g Range
Full resolution enabled
13
Bits
SENSITIVITY
Each axis
Sensitivity at XOUT, YOUT, ZOUT
Any g-range, full resolution mode
1024
LSB/g
±0.5 g, 10-bit or full resolution
921
1024
1126
LSB/g
±1 g, 10-bit resolution
460
512
563
LSB/g
±2 g, 10-bit resolution
230
256
282
LSB/g
±4 g, 10-bit resolution
115
128
141
LSB/g
Sensitivity Change Due to Temperature
±0.01
%/°C
0 g BIAS LEVEL
Each axis
Initial 0 g Output
T = 25°C, XOUT, YOUT
±50
mg
T = 25°C, ZOUT
±75
mg
0 g Output Drift over Temperature
−40°C < T < +105°C, XOUT, YOUT, referenced to initial 0 g output
−125
+125
mg
−40°C < T < +105°C, ZOUT, referenced to initial 0 g output
−200
+200
mg
0 g Offset Tempco
XOUT, YOUT
±0.5
mg/°C
ZOUT
±0.75
mg/°C
NOISE PERFORMANCE
Noise Density
X-, Y-axes
150
µg/√Hz
Z-axis
250
µg/√Hz
RMS Noise
X-, Y-axes, 100 Hz output data rate (ODR)
1.5
mg rms
Z-axis, 100 Hz ODR
2.5
mg rms
OUTPUT DATA RATE/BANDWIDTH
User selectable
Measurement Rate3
6.25
3200
Hz
SELF TEST4
Data rate ≥ 100 Hz, 2.0 V ≤ VS ≤ 3.6 V
Output Change in X-Axis
0.20
2.36
g
Output Change in Y-Axis
−2.36
−0.20
g
Output Change in Z-Axis
0.30
3.70
g
POWER SUPPLY
Operating Voltage Range (VS)
2.0
3.6
V
Interface Voltage Range (VDD I/O)
1.7
VS
V
Supply Current
Data rate > 100 Hz
100
170
300
µA
Data rate < 10 Hz
30
55
110
µA
Standby Mode Leakage Current
0.1
2
µA
Turn-On (Wake-Up) Time5
1.4
ms
TEMPERATURE
Operating Temperature Range
−40
+105
°C
1
All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
2
Cross-axis sensitivity is defined as coupling between any two axes.
3
Bandwidth is half the output data rate.
4
Self test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register, Address 0x31) minus the output (g) when the SELF_TEST bit =
0 (in the DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self test, where τ = 1/(data rate).
5
Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For
other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate).




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