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Zakładka z wyszukiwarką danych komponentów |
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Zakładka z wyszukiwarką danych komponentów |
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ADG333ABR Arkusz danych(PDF) 10 Page - Analog Devices |
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ADG333ABR Arkusz danych(HTML) 10 Page - Analog Devices |
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10 / 12 page  ADG333A Rev. A | Page 10 of 12 TEST CIRCUITS VD IDS SD RON = V1/IDS V1 Figure 14. On Resistance VD SD IS (OFF) VS A Figure 15. Off Leakage VD SD NC NC = NO CONNECT ID (ON) A Figure 16. On Leakage D GND IN SA SB –10V +10V VDD VDD VSS VSS VS VOUT RL 300 Ω CL 35pF 0.1 µF 0.1 µF 50% 50% 50% 50% tON tOFF VIN VS +3V 0V +10V 0V –10V Figure 17. Switching Times D GND IN SA SB VDD VDD VSS VSS VS VOUT RL 300 Ω CL 35pF 0.1 µF 0.1 µF 3V 0V VIN VOUT VS 50% 50% tOPEN Figure 18. Break-Before-Make Delay, tOPEN VDD VDD VSS VSS VOUT IN CL 10nF GND VIN VOUT QINJ = CL × ∆VOUT ∆V OUT 3V 0V 0V DSA VD RD Figure 19. Charge Injection VSS VOUT GND SD VIN VS VDD VDD VSS 0.1 µF 0.1 µF RL 75 Ω VSS GND SD VIN1 VS VDD VDD VSS 0.1 µF 0.1 µF VOUT NC CHANNEL-TO-CHANNEL CROSSTALK 20 × LOG |V S/VOUT| VIN2 75 Ω RL 75 Ω SD Figure 20. Off Isolation Figure 21. Channel-to-Channel Crosstalk |
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