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ADG451BCHIPS Arkusz danych(PDF) 5 Page - Analog Devices

Numer części ADG451BCHIPS
Szczegółowy opis  LC2MOS 5 廓 RON SPST Switches
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ADG451BCHIPS Arkusz danych(HTML) 5 Page - Analog Devices

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ADG451/ADG452/ADG453
Rev. C | Page 5 of 16
12 V SINGLE SUPPLY
VDD = 12 V, VSS = 0 V, VL = 5 V, GND = 0 V. All specifications TMIN to TMAX, unless otherwise noted.
Table 2.
B Version1
Parameter
25°C
TMIN to TMAX
Unit
Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range
0 V to VDD
V
On Resistance (RON)
6
Ω typ
VD = 0 V to +10 V, IS = −10 mA
8
10
Ω max
On Resistance Match Between Channels (ΔRON)
0.1
Ω typ
VD = 10 V, IS = −10 mA
0.5
0.5
Ω max
On Resistance Flatness (RFLAT(ON))
1.0
1.0
Ω typ
VD = 0 V, 5 V, IS = −10 mA
LEAKAGE CURRENTS2, 3
Source Off Leakage, IS (OFF)
±0.02
nA typ
VD = 0 V, 10 V, VS = 0 V, 10 V; see Figure 17
±0.5
±2.5
nA max
Drain Off Leakage, ID (OFF)
±0.02
nA typ
VD = 0 V, 10 V, VS = 0 V, 10 V; see Figure 17
±0.5
±2.5
nA max
Channel On Leakage, ID, IS (ON)
±0.04
nA typ
VD = VS = 0 V, 10 V; see Figure 18
±1
±5
nA max
DIGITAL INPUTS
Input High Voltage, VINH
2.4
V min
Input Low Voltage, VINL
0.8
V max
Input Current, IINL or IINH
0.005
μA typ
VIN = VINL or VINH
±0.5
μA max
DYNAMIC CHARACTERISTICS4
tON
100
ns typ
RL = 300 Ω, CL = 35 pF, VS = 8 V; see Figure 19
220
260
ns max
tOFF
80
ns typ
RL = 300 Ω, CL = 35 pF, VS = 8 V; see Figure 19
160
200
ns max
Break-Before-Make Time Delay, tD (ADG453 Only)
15
ns typ
RL = 300 Ω, CL = 35 pF, VS1 = VS2 = 8 V;
see Figure 20
10
10
ns min
Charge Injection
10
pC typ
VS = 6 V, RS = 0 Ω, CL = 1.0 nF; see Figure 21
Channel-to-Channel Crosstalk
−90
dB typ
RL = 50 Ω, CL = 5 pF, f = 1 MHz; see Figure
23
CS (OFF)
60
pF typ
f = 1 MHz
CD (OFF)
60
pF typ
f = 1 MHz
CD, CS (ON)
100
pF typ
f = 1 MHz
POWER REQUIREMENTS
VDD = 13.2 V; digital inputs = 0 V or 5 V
IDD
0.0001
μA typ
0.5
5
μA max
IL
0.0001
μA typ
0.5
5
μA max
VL = 5.5 V
IGND4
0.0001
μA typ
0.5
5
μA max
VL = 5.5 V
1 Temperature range for B version is −40°C to +85°C.
2 TMAX = 70°C.
3 Tested with dual supplies.
4 Guaranteed by design, not subject to production test.


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