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ADS931E Arkusz danych(PDF) 2 Page - Texas Instruments |
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ADS931E Arkusz danych(HTML) 2 Page - Texas Instruments |
2 / 16 page ADS931 2 SBAS060A ELECTROSTATIC DISCHARGE SENSITIVITY This integrated circuit can be damaged by ESD. Texas Instru- ments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degrada- tion to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. +VS ....................................................................................................... +6V Analog Input ........................................................... (–0.3V) to (+VS +0.3V) Logic Input ............................................................. (–0.3V) to (+VS +0.3V) Case Temperature ......................................................................... +100 °C Junction Temperature .................................................................... +150 °C Storage Temperature ..................................................................... +150 °C ABSOLUTE MAXIMUM RATINGS PACKAGE SPECIFIED DRAWING TEMPERATURE PACKAGE ORDERING TRANSPORT PRODUCT PACKAGE NUMBER RANGE MARKING NUMBER(1) MEDIA ADS931E SSOP-28 Surface Mount 324 –40 °C to +85°C ADS931E ADS931E Rails "" " " " ADS931E/1K Tape and Reel NOTES: (1) Models with a slash (/) are available only in Tape and Reel in the quantities indicated (e.g., /1K indicates 1000 devices per reel). Ordering 1000 pieces of “ADS931E/1K” will get a single 1000-piece Tape and Reel. PACKAGE/ORDERING INFORMATION ELECTRICAL CHARACTERISTICS At TA = full specified temperature range unless otherwise noted. +VS = LVDD = +3V, specified single-ended input (1V to 2V) and sampling rate = 30MHz, unless otherwise specified. The input range is 2.25V to 3.25V when specified for +5V operation. ADS931E PARAMETER CONDITIONS MIN TYP MAX UNITS RESOLUTION 8 Bits SPECIFIED TEMPERATURE RANGE Ambient Air –40 to +85 °C ANALOG INPUT Specified Full Scale Input Range(1) 1Vp-p +1.0 +2.0 V Common-mode Voltage +1.5 V Analog Input Bias Current 1 µA Input Impedance 1.25 || 5 M Ω || pF DIGITAL INPUTS Logic Family TTL/HCT Compatible CMOS High Input Voltage, VIH +2.0 LVDD V Low Input Voltage, VIL +0.8 V High Input Current, IIH ±10 µA Low Input Current, IIL ±10 µA Input Capacitance 5pF CONVERSION CHARACTERISTICS Start Conversion Rising Edge of Convert Clock Sample Rate 10k 33M Samples/s Data Latency 5 Clk Cycles DYNAMIC CHARACTERISTICS Differential Linearity Error VS = +3V and +5V f = 500kHz ±0.7 ±1.0 LSB f = 12.5MHz ±0.7 LSB No Missing Codes VS = +3V and +5V Guaranteed Integral Nonlinearity Error, f = 500kHz VS = +3V and +5V ±1.0 ±2.5 LSB Spurious Free Dynamic Range(2) VS = +3V and +5V f = 500kHz (–1dBFS input) 49 dBFS(3) f = 12.5MHz (–1dBFS input) 43 49 dBFS Two-Tone Intermodulation Distortion(4) f = 3.6MHz and 3.5MHz (–7dBFS each tone) 54 dBFS Signal-to-Noise Ratio (SNR) VS = +3V and +5V f = 500kHz (–1dBFS input) 48 dB f = 12.5MHz (–1dBFS input) 44 48 dB Signal-to-(Noise + Distortion) (SINAD) VS = +3V and +5V f = 500kHz (–1dBFS input) 45 dB f = 12.5MHz (–1dBFS input) 40 45 dB Effective Number of Bits f = 12MHz(5) 7.2 Bits Differential Gain Error NTSC, PAL 2.3 % Differential Phase Error NTSC, PAL 1 degrees |
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