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ADXL362BCCZ-R2 Arkusz danych(PDF) 18 Page - Analog Devices |
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ADXL362BCCZ-R2 Arkusz danych(HTML) 18 Page - Analog Devices |
18 / 44 page ADXL362 Data Sheet Rev. PrA Page 4 of 8 ADDITIONAL FEATURES FREE FALL DETECTION Many digital output accelerometers include a built-in free fall detection feature. In the ADXL362, this function can be imple- mented using the inactivity interrupt. Refer to the Applications Information section for more details, including suggested threshold and timing values. EXTERNAL CLOCK The ADXL362 has a built-in 51.2 kHz (typical) clock that, by default, serves as the time base for internal operations. ODR and bandwidth scale proportionally with the clock. The ADXL362 provides a discrete number of options for ODR, such as 100 Hz, 50 Hz, 25 Hz, and so forth, in factors of 2, (see the Filter Control Register section for a complete listing). To achieve data rates other than those provided, an external clock can be used at the appropriate clock frequency. The output data rate scales with the clock frequency, as shown in Equation 3. kHz 2 . 51 f ODR ODR SELECTED ACTUAL × = (3) For example, to achieve an 80 Hz ODR, select the 100 Hz ODR setting and provide a clock frequency that is 80% of nominal, or 41.0 kHz. The ADXL362 can operate with external clock frequencies ranging from the nominal 51.2 kHz down to 25.6 kHz to allow the user to achieve any desired output data rate. Alternatively, an external clock can be used to improve clock frequency accuracy. The distribution of clock frequencies among a sampling of >1000 parts has a standard deviation of approximately 3%. To achieve tighter tolerances, a more accurate clock can be provided externally. Bandwidth automatically scales to ½ or ¼ of the ODR (based on the HALF_BW setting), and this ratio is preserved, regardless of clock frequency. Power consumption also scales with clock frequency: higher clock rates increase power consumption. Figure 34 shows how power consumption varies with clock rate. 3.0 2.5 2.0 1.5 1.0 0.5 0 EXTERNAL CLOCK FREQUENCY (kHz) 43 44 45 46 47 48 49 50 51 52 VS = 1.6V VS = 2.0V VS = 3.5V Figure 34. Current Consumption vs. External Clock Rate SYNCHRONIZED DATA SAMPLING For applications that require a precisely timed acceleration measurement, the ADXL362 features an option to synchronize acceleration sampling to an external trigger. SELF TEST The ADXL362 incorporates a self test feature that effectively tests its mechanical and electronic systems simultaneously. When the self test function is invoked, an electrostatic force is applied to the mechanical sensor. This electrostatic force moves the mechanical sensing element in the same manner as acceleration, and it is additive to the acceleration experienced by the device. This added electrostatic force results in an output change on all three axes. USER REGISTER PROTECTION The ADXL362 includes user register protection for single event upsets (SEUs). An SEU is a change of state caused by ions or electromagnetic radiation striking a sensitive node in a micro- electronic device. The state change is a result of the free charge created by ionization in or close to an important node of a logic element (for example, a memory bit). The SEU, itself, is not con- sidered permanently damaging to transistor or circuit functionality, but it can create erroneous register values. The ADXL362 registers that are protected from SEU are Register 0x20 to Register 0x2E. SEU protection is implemented via a 99-bit error correcting (Hamming-type) code that detects both single- and double-bit errors. The check bits are recomputed any time a write to any of the protected registers occurs. At any time, if the stored version of the check bits is not in agreement with the current check bit calculation, the ERR_USER_REGS status bit is set. The SEU bit in the status register is set on power-up prior to device configuration; it clears upon the first register write to that device. TEMPERATURE SENSOR The ADXL362 includes an integrated temperature sensor that can monitor internal system temperature or improve the tempera- ture stability of the device via calibration. For example, acceleration outputs vary with temperature at a rate of ±0.5 mg/°C (typical), but the relationship to temperature is repeatable and can be calibrated. To use the temperature sensor to monitor absolute temperature, it is recommended that its initial bias (its output at some known temperature) is measured and calibrated. |
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