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BAT54CW Arkusz danych(PDF) 5 Page - NXP Semiconductors

Numer części BAT54CW
Szczegółowy opis  Planar Schottky barrier diodes with an integrated guard ring for stress protection, encapsulated in a very small SOT323
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Producent  NXP [NXP Semiconductors]
Strona internetowa  http://www.nxp.com
Logo NXP - NXP Semiconductors

BAT54CW Arkusz danych(HTML) 5 Page - NXP Semiconductors

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BAT54W_SER
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2012. All rights reserved.
Product data sheet
Rev. 3 — 20 November 2012
5 of 11
NXP Semiconductors
BAT54W series
Schottky barrier diodes
8.
Test information
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
f=1MHz; Tamb =25 C
Fig 3.
Diode capacitance as a function of reverse voltage; typical values
006aac891
VR (V)
030
20
10
4
6
2
8
10
Cd
(pF)
0
(1) IR =1mA
Fig 4.
Reverse recovery time test circuit and waveforms
trr
(1)
+ IF
t
output signal
tr
tp
t
10 %
90 %
VR
input signal
V = VR + IF × RS
RS = 50 Ω
IF
D.U.T.
Ri = 50 Ω
SAMPLING
OSCILLOSCOPE
mga881


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