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ADXL375BCCZ-RL7 Datasheet(Arkusz danych) 3 Page - Analog Devices

Numer części ADXL375BCCZ-RL7
Szczegółowy opis  3-Axis, 200 g Digital Accelerometer
Pobierz  32 Pages
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Producent  AD [Analog Devices]
Strona internetowa  http://www.analog.com
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Data Sheet
ADXL375
Rev. 0 | Page 3 of 32
SPECIFICATIONS
TA = 25°C, VS = 2.5 V, VDD I/O = 2.5 V, acceleration = 0 g, CS = 10 µF tantalum, CI/O = 0.1 µF, output data rate (ODR) = 800 Hz, unless
otherwise noted.
Table 1.
Parameter
Test Conditions/Comments
Min
Typ1
Max
Unit
SENSOR INPUT
Each axis
Measurement Range2
±180
±200
g
Nonlinearity
Percentage of full scale
±0.25
%
Cross-Axis Sensitivity3
±2.5
%
SENSITIVITY
Each axis
Sensitivity at XOUT, YOUT, ZOUT2, 4
ODR ≤ 800 Hz
18.4
20.5
22.6
LSB/g
Scale Factor at XOUT, YOUT, ZOUT2, 4
ODR ≤ 800 Hz
44
49
54
mg/LSB
Sensitivity Change Due to Temperature
±0.02
%/°C
0 g OFFSET
Each axis
0 g Output for XOUT, YOUT, ZOUT
−6000
±400
+6000
mg
0 g Offset vs. Temperature
±10
mg/°C
NOISE
X-, y-, and z-axes
5
mg/√Hz
OUTPUT DATA RATE AND BANDWIDTH5
User selectable
Output Data Rate (ODR)4, 6
0.1
3200
Hz
SELF-TEST7
Output Change in Z-Axis
6.4
g
POWER SUPPLY
Operating Voltage Range (VS)
2.0
2.5
3.6
V
Interface Voltage Range (VDD I/O)
1.7
1.8
VS
V
Supply Current
Measurement Mode
ODR ≥ 100 Hz
145
µA
ODR ≤ 3 Hz
35
µA
Standby Mode
0.1
µA
Turn-On and Wake-Up Time8
ODR = 3200 Hz
1.4
ms
TEMPERATURE
Operating Temperature Range
−40
+85
°C
WEIGHT
Device Weight
30
mg
1
Typical specifications are for at least 68% of the population of parts and are based on the worst case of mean ± 1 σ distribution, except for sensitivity, which represents
the target value.
2
Minimum and maximum specifications represent the worst case of mean ± 3 σ distribution and are not guaranteed in production.
3
Cross-axis sensitivity is defined as coupling between any two axes.
4
The output format for the 1600 Hz and 3200 Hz output data rates is different from the output format for the other output data rates. For more information, see the
Data Formatting at Output Data Rates of 3200 Hz and 1600 Hz section.
5
Bandwidth is the −3 dB frequency and is half the output data rate: bandwidth = ODR/2.
6
Output data rates < 6.25 Hz exhibit additional offset shift with increased temperature.
7
Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (DATA_FORMAT register, Address 0x31) minus the output (g) when the SELF_TEST bit = 0.
Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate). For the self-test to operate correctly,
the part must be in normal power operation (LOW_POWER bit = 0 in the BW_RATE register, Address 0x2C).
8
Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For
other data rates, the turn-on and wake-up times are each approximately τ + 1.1 ms, where τ = 1/(data rate).




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