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ADT7317ARQ-REEL Arkusz danych(PDF) 5 Page - Analog Devices

Numer części ADT7317ARQ-REEL
Szczegółowy opis  Accurate Digital Temperature Sensor
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ADT7317ARQ-REEL Arkusz danych(HTML) 5 Page - Analog Devices

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ADT7316/ADT7317/ADT7318
Rev. B | Page 5 of 44
Parameter1
Min
Typ
Max
Unit
Conditions/Comments
DIGITAL OUTPUT
Output High Voltage, VOH
2.4
V
ISOURCE = ISINK = 200 μA.
Output Low Voltage, VOL
0.4
V
IOL = 3 mA.
Output High Current, IOH
1
mA
VOH = 5 V.
Output Capacitance, COUT
50
pF
INT/INT Output Saturation Voltage
0.8
V
IOUT = 4 mA.
I2C TIMING CHARACTERISTICS7, 8
Serial Clock Period, t1
2.5
μs
Fast-mode I2C. See
Figure 4.
Data In Setup Time to SCL High, t2
50
ns
Data Out Stable After SCL Low, t3
0
ns
See
Figure 4.
SDA Low Setup Time to SCL Low
(Start Condition), t4
50
ns
See
Figure 4.
SDA High Hold Time After SCL High
(Stop Condition), t5
50
ns
See
Figure 4.
SDA and SCL Fall Time, t6
300
ns
See
Figure 4.
SDA and SCL Rise Time, t6
3009
ns
See
Figure 4.
SPI TIMING CHARACTERISTICS10, 11
CS to SCLK Setup Time, t1
0
ns
See
Figure 7.
SCLK High Pulse Width, t2
50
ns
See
Figure 7.
SCLK Low Pulse Width, t3
50
ns
See
Figure 7.
Data Access Time After SCLK Falling
Edge, t412
35
ns
See
Figure 7.
Data Setup Time Prior to SCLK
Rising Edge, t5
20
ns
See
Figure 7.
Data Hold Time after SCLK Rising
Edge, t6
0
ns
See
Figure 7.
CS to SCLK Hold Time, t7
0
ns
See
Figure 7.
CS to DOUT High Impedance, t8
40
ns
See
Figure 7.
POWER REQUIREMENTS
VDD
2.7
5.5
V
VDD Settling Time
50
ms
VDD settles to within 10% of its final voltage level.
IDD (Normal Mode)13
3
mA
VDD = 3.3 V, VIH = VDD, and VIL = GND.
2.2
3
mA
VDD = 5 V, VIH = VDD , and VIL = GND.
IDD (Power-Down Mode)
10
μA
VDD = 3.3 V, VIH = VDD, and VIL = GND.
10
μA
VDD = 5 V, VIH = VDD, and VIL = GND.
Power Dissipation
10
mW
VDD = 3.3 V, using normal mode.
33
μW
VDD = 3.3 V, using shutdown mode.
1 See the Terminology section.
2 DC specifications tested with the outputs unloaded.
3 Linearity is tested using a reduced code range: ADT7316 (Code 115 to 4095); ADT7317 (Code 28 to 1023); ADT7318 (Code 8 to 255).
4 A round robin is the continuous sequential measurement of the following three channels: VDD, internal temperature, and external temperature.
5 Guaranteed by design and characterization, but not production tested.
6 For the amplifier output to reach its minimum voltage, the offset error must be negative. For the amplifier output to reach its maximum voltage, VREF = VDD, offset plus
gain error must be positive.
7 The SDA and SCL timing is measured with the input filters turned on to meet the fast-mode I2C specification. Switching off the input filters improves the transfer rate,
but has a negative effect on the EMC behavior of the part.
8 Guaranteed by design. Not tested in production.
9 The interface is also capable of handling the I2C standard mode rise time specification of 1000 ns.
10 Guaranteed by design and characterization, but not production tested.
11 All input signals are specified with tr = tf = 5 ns (10% to 90% of VDD) and timed from a voltage level of 1.6 V.
12 Measured with the load circuit of Figure 5.
13 IDD specification is valid for all DAC codes. Interface inactive. All DACs active. Load currents excluded.


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