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ADXRS624WBBGZ Datasheet(Arkusz danych) 10 Page - Analog Devices

Numer części ADXRS624WBBGZ
Szczegółowy opis  50,-50/s Yaw Rate Gyro
Pobierz  12 Pages
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Producent  AD [Analog Devices]
Strona internetowa  http://www.analog.com
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ADXRS624
Rev. A | Page 10 of 12
behavior. Typical ratiometricity error for null, sensitivity, self-
test, and temperature output is outlined in Table 4.
Note that VRATIO must never be greater than AVCC.
Table 4. Ratiometricity Error for Various Parameters
Parameter
V
S = VRATIO = 4.75 V
V
S = VRATIO = 5.25 V
ST1
Mean
−0.4%
−0.3%
Sigma
0.6%
0.6%
ST2
Mean
−0.4%
−0.3%
Sigma
0.6%
0.6%
Null
Mean
−0.04%
−0.02%
Sigma
0.3%
0.2%
Sensitivity
Mean
0.03%
0.1%
Sigma
0.1%
0.1%
V
TEMP
Mean
−0.3%
−0.5%
Sigma
0.1%
0.1%
NULL ADJUSTMENT
The nominal 2.5 V null is for a symmetrical swing range at
RATEOUT (1B, 2A). However, a nonsymmetrical output swing
may be suitable in some applications. Null adjustment is
possible by injecting a suitable current to SUMJ (1C, 2C). Note
that supply disturbances may reflect some null instability.
Digital supply noise should be avoided particularly in this case.
SELF-TEST FUNCTION
The ADXRS624 includes a self-test feature that actuates each of
the sensing structures and associated electronics as if subjected
to angular rate. The self-test feature is activated by standard
logic high levels applied to Input ST1 (5F, 5G), Input ST2 (4F,
4G), or both. ST1 causes the voltage at RATEOUT to change
about −1.9 V, and ST2 causes an opposite change of +1.9 V. The
self-test response follows the viscosity temperature dependence
of the package atmosphere, approximately 0.25%/°C.
Activating both ST1 and ST2 simultaneously is not damaging.
ST1 and ST2 are fairly closely matched (±5%), but actuating
both simultaneously may result in a small apparent null bias
shift proportional to the degree of self-test mismatch.
ST1 and ST2 are activated by applying a voltage of greater than
0.8 × VRATIO to the ST1 and ST2 pins. ST1 and ST2 are deactivated
by applying a voltage of less than 0.2 × VRATIO to the ST1 and
ST2 pins. The voltage applied to ST1 and ST2 must never be
greater than AVCC.
CONTINUOUS SELF-TEST
The one-chip integration of the ADXRS624 gives it higher
reliability than is obtainable with any other high volume
manufacturing method. In addition, it is manufactured
under a mature BiMOS process with field-proven reliability.
As an additional failure detection measure, a power-on
self-test can be performed. However, some applications may
warrant continuous self-test while sensing rate. Details
outlining continuous self-test techniques are also available
in the AN-768 Application Note.




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