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ADXL343BCCZ Arkusz danych(PDF) 20 Page - Analog Devices |
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ADXL343BCCZ Arkusz danych(HTML) 20 Page - Analog Devices |
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20 / 36 page  ADXL343 Data Sheet Rev. 0 | Page 20 of 36 SELF-TEST The ADXL343 incorporates a self-test feature that effectively tests its mechanical and electronic systems simultaneously. When the self-test function is enabled (via the SELF_TEST bit in the DATA_FORMAT register, Address 0x31), an electrostatic force is exerted on the mechanical sensor. This electrostatic force moves the mechanical sensing element in the same manner as acceleration, and it is additive to the acceleration experienced by the device. This added electrostatic force results in an output change in the x-, y-, and z-axes. Because the electrostatic force is proportional to VS2, the output change varies with VS. This effect is shown in Figure 33. The scale factors shown in Table 14 can be used to adjust the expected self-test output limits for different supply voltages, VS. The self-test feature of the ADXL343 also exhibits a bimodal behavior. However, the limits shown in Table 1 and Table 15 to Table 18 are valid for both potential self-test values due to bimodality. Use of the self-test feature at data rates less than 100 Hz or at 1600 Hz may yield values outside these limits. Therefore, the part must be in normal power operation (LOW_POWER bit = 0 in BW_RATE register, Address 0x2C) and be placed into a data rate of 100 Hz through 800 Hz or 3200 Hz for the self-test function to operate correctly. –6 –4 –2 0 2 4 6 2.0 2.5 3.3 3.6 VS (V) X HIGH X LOW Y HIGH Y LOW Z HIGH Z LOW Figure 33. Self-Test Output Change Limits vs. Supply Voltage Table 14. Self-Test Output Scale Factors for Different Supply Voltages, VS Supply Voltage, VS (V) X-Axis, Y-Axis Z-Axis 2.00 0.64 0.8 2.50 1.00 1.00 3.30 1.77 1.47 3.60 2.11 1.69 Table 15. Self-Test Output in LSB for ±2 g, 10-Bit or Full Resolution (TA = 25°C, VS = 2.5 V, VDDI/O = 1.8 V) Axis Min Max Unit X 50 540 LSB Y −540 −50 LSB Z 75 875 LSB Table 16. Self-Test Output in LSB for ±4 g, 10-Bit Resolution (TA = 25°C, VS = 2.5 V, VDDI/O = 1.8 V) Axis Min Max Unit X 25 270 LSB Y −270 −25 LSB Z 38 438 LSB Table 17. Self-Test Output in LSB for ±8 g, 10-Bit Resolution (TA = 25°C, VS = 2.5 V, VDDI/O = 1.8 V) Axis Min Max Unit X 12 135 LSB Y −135 −12 LSB Z 19 219 LSB Table 18. Self-Test Output in LSB for ±16 g, 10-Bit Resolution (TA = 25°C, VS = 2.5 V, VDDI/O = 1.8 V) Axis Min Max Unit X 6 67 LSB Y −67 −6 LSB Z 10 110 LSB |
Podobny numer części - ADXL343BCCZ |
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Podobny opis - ADXL343BCCZ |
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