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ADXL350BCEZ-RL7 Datasheet(Arkusz danych) 3 Page - Analog Devices

Numer części ADXL350BCEZ-RL7
Szczegółowy opis  Digital Accelerometer
Pobierz  36 Pages
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Producent  AD [Analog Devices]
Strona internetowa  http://www.analog.com
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Data Sheet
ADXL350
Rev. 0 | Page 3 of 36
SPECIFICATIONS
TA = 25°C, VS= 2.5 V, VDDI/O = 2.5 V, acceleration = 0 g, and CIO = 0.1 μF, unless otherwise noted. All minimum and maximum
specifications are guaranteed. Typical specifications are not guaranteed.
Table 1.
Parameter
Test Conditions
Min
Typ
Max
Unit
SENSOR INPUT
Each axis
Measurement Range
User selectable
±1, ±2, ±4, ±8
g
Nonlinearity
Percentage of full scale
±0.5
%
Inter-Axis Alignment Error
±0.1
Degrees
Cross-Axis Sensitivity1
±3
%
OUTPUT RESOLUTION
Each axis
All g Ranges
10-bit resolution
10
Bits
±1 g Range
Full resolution
10
Bits
±2 g Range
Full resolution
11
Bits
±4 g Range
Full resolution
12
Bits
±8 g Range
Full resolution
13
Bits
SENSITIVITY
Each axis
Sensitivity at XOUT, YOUT, ZOUT
Any g-range, full resolution
473.6
512
550.4
LSB/g
Scale Factor at XOUT, YOUT, ZOUT
Any g-range, full resolution
1.80
1.95
2.10
mg/LSB
Sensitivity at XOUT, YOUT, ZOUT
±1 g, 10-bit resolution
473.6
512
550.4
LSB/g
Scale Factor at XOUT, YOUT, ZOUT
±1 g, 10-bit resolution
1.80
1.95
2.10
mg/LSB
Sensitivity at XOUT, YOUT, ZOUT
±2 g, 10-bit resolution
236.8
256
275.2
LSB/g
Scale Factor at XOUT, YOUT, ZOUT
±2 g, 10-bit resolution
3.61
3.91
4.21
mg/LSB
Sensitivity at XOUT, YOUT, ZOUT
±4 g, 10-bit resolution
118.4
128
137.6
LSB/g
Scale Factor at XOUT, YOUT, ZOUT
±4 g, 10-bit resolution
7.22
7.81
8.40
mg/LSB
Sensitivity at XOUT, YOUT, ZOUT
±8 g, 10-bit resolution
59.2
64
68.8
LSB/g
Scale Factor at XOUT, YOUT, ZOUT
±8 g, 10-bit resolution
14.45
15.63
16.80
mg/LSB
Sensitivity Change Due to Temperature
±0.01
%/°C
0 g BIAS LEVEL
Each axis
0 g Output for XOUT, YOUT
−150
±50
+150
Mg
0 g Output for ZOUT
−250
±75
+250
Mg
0 g Offset vs. Temperature (X Axis and Y Axis)2
−0.31
±0.17
+0.31
mg/°C
0 g Offset vs. Temperature (Z Axis)2
−0.49
±0.24
+0.49
mg/°C
NOISE PERFORMANCE
Noise (X-Axis and Y-Axis)
100 Hz data rate, full resolution
1.1
LSB rms
Noise (Z-Axis)
100 Hz data rate, full resolution
1.7
LSB rms
OUTPUT DATA RATE AND BANDWIDTH
User selectable
Measurement Rate3
6.25
3200
Hz
SELF-TEST4
Data rate ≥ 100 Hz, 2.0 V ≤ VS ≤ 3.6 V
Output Change in X-Axis
0.2
2.1
g
Output Change in Y-Axis
−2.1
−0.2
g
Output Change in Z-Axis
0.3
3.4
g
POWER SUPPLY
Operating Voltage Range (VS)
2.0
2.5
3.6
V
Interface Voltage Range (VDD I/O)
1.7
1.8
VS
V
Supply Current
Data rate > 100 Hz
166
µA
Data rate < 10 Hz
45
µA
Standby Mode Leakage Current
0.1
2
µA
Turn-On Time5
Data rate = 3200 Hz
1.4
ms
OPERATING TEMPERATURE RANGE
−40
+85
oC
1 Cross-axis sensitivity is defined as coupling between any two axes.
2 Offset vs. temperature minimum/maximum specifications are guaranteed by characterization and represent a mean ±3σ distribution.
3 Bandwidth is half the output data rate.
4 Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register) minus the output (g) when the SELF_TEST bit = 0 (in the
DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate).
5 Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms.
For other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate).




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