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ADXL350BCEZ-RL Arkusz danych(PDF) 3 Page - Analog Devices |
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ADXL350BCEZ-RL Arkusz danych(HTML) 3 Page - Analog Devices |
3 / 36 page Data Sheet ADXL350 Rev. 0 | Page 3 of 36 SPECIFICATIONS TA = 25°C, VS= 2.5 V, VDDI/O = 2.5 V, acceleration = 0 g, and CIO = 0.1 μF, unless otherwise noted. All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed. Table 1. Parameter Test Conditions Min Typ Max Unit SENSOR INPUT Each axis Measurement Range User selectable ±1, ±2, ±4, ±8 g Nonlinearity Percentage of full scale ±0.5 % Inter-Axis Alignment Error ±0.1 Degrees Cross-Axis Sensitivity1 ±3 % OUTPUT RESOLUTION Each axis All g Ranges 10-bit resolution 10 Bits ±1 g Range Full resolution 10 Bits ±2 g Range Full resolution 11 Bits ±4 g Range Full resolution 12 Bits ±8 g Range Full resolution 13 Bits SENSITIVITY Each axis Sensitivity at XOUT, YOUT, ZOUT Any g-range, full resolution 473.6 512 550.4 LSB/g Scale Factor at XOUT, YOUT, ZOUT Any g-range, full resolution 1.80 1.95 2.10 mg/LSB Sensitivity at XOUT, YOUT, ZOUT ±1 g, 10-bit resolution 473.6 512 550.4 LSB/g Scale Factor at XOUT, YOUT, ZOUT ±1 g, 10-bit resolution 1.80 1.95 2.10 mg/LSB Sensitivity at XOUT, YOUT, ZOUT ±2 g, 10-bit resolution 236.8 256 275.2 LSB/g Scale Factor at XOUT, YOUT, ZOUT ±2 g, 10-bit resolution 3.61 3.91 4.21 mg/LSB Sensitivity at XOUT, YOUT, ZOUT ±4 g, 10-bit resolution 118.4 128 137.6 LSB/g Scale Factor at XOUT, YOUT, ZOUT ±4 g, 10-bit resolution 7.22 7.81 8.40 mg/LSB Sensitivity at XOUT, YOUT, ZOUT ±8 g, 10-bit resolution 59.2 64 68.8 LSB/g Scale Factor at XOUT, YOUT, ZOUT ±8 g, 10-bit resolution 14.45 15.63 16.80 mg/LSB Sensitivity Change Due to Temperature ±0.01 %/°C 0 g BIAS LEVEL Each axis 0 g Output for XOUT, YOUT −150 ±50 +150 Mg 0 g Output for ZOUT −250 ±75 +250 Mg 0 g Offset vs. Temperature (X Axis and Y Axis)2 −0.31 ±0.17 +0.31 mg/°C 0 g Offset vs. Temperature (Z Axis)2 −0.49 ±0.24 +0.49 mg/°C NOISE PERFORMANCE Noise (X-Axis and Y-Axis) 100 Hz data rate, full resolution 1.1 LSB rms Noise (Z-Axis) 100 Hz data rate, full resolution 1.7 LSB rms OUTPUT DATA RATE AND BANDWIDTH User selectable Measurement Rate3 6.25 3200 Hz SELF-TEST4 Data rate ≥ 100 Hz, 2.0 V ≤ VS ≤ 3.6 V Output Change in X-Axis 0.2 2.1 g Output Change in Y-Axis −2.1 −0.2 g Output Change in Z-Axis 0.3 3.4 g POWER SUPPLY Operating Voltage Range (VS) 2.0 2.5 3.6 V Interface Voltage Range (VDD I/O) 1.7 1.8 VS V Supply Current Data rate > 100 Hz 166 µA Data rate < 10 Hz 45 µA Standby Mode Leakage Current 0.1 2 µA Turn-On Time5 Data rate = 3200 Hz 1.4 ms OPERATING TEMPERATURE RANGE −40 +85 oC 1 Cross-axis sensitivity is defined as coupling between any two axes. 2 Offset vs. temperature minimum/maximum specifications are guaranteed by characterization and represent a mean ±3σ distribution. 3 Bandwidth is half the output data rate. 4 Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register) minus the output (g) when the SELF_TEST bit = 0 (in the DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate). 5 Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate). |
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