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ADXL350BCEZ-RL Arkusz danych(PDF) 31 Page - Analog Devices

Numer części ADXL350BCEZ-RL
Szczegółowy opis  Digital Accelerometer
Download  36 Pages
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Strona internetowa  http://www.analog.com
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ADXL350BCEZ-RL Arkusz danych(HTML) 31 Page - Analog Devices

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Data Sheet
ADXL350
Rev. 0 | Page 31 of 36
With the stored values for self-test enabled and disabled, the
self-test change is as follows:
XST = XST_ON − XST_OFF
YST = YST_ON − YST_OFF
ZST = ZST_ON − ZST_OFF
Because the measured output for each axis is expressed in LSBs,
XST, YST, and ZST are also expressed in LSBs. These values can be
converted to g’s of acceleration by multiplying each value by the
2 mg/LSB scale factor, if configured for full-resolution, 8 g mode.
Additionally, Table 13 through Table 16 correspond to the self-
test range converted to LSBs and can be compared with the
measured self-test change. If the part was placed into full-
resolution, 8 g mode, the values listed in Table 13 should be used.
Although the fixed 10-bit mode or a range other than 8 g can be
used, a different set of values, as indicated in Table 14 through
Table 16, would need to be used. Using a range below 8 g may
result in insufficient dynamic range and should be considered
when selecting the range of operation for measuring self-test. In
addition, note that the range in Table 1 and the values in Table 13
through Table 16 take into account all possible supply voltages, VS,
and no additional conversion due to VS is necessary.
If the self-test change is within the valid range, the test is considered
successful. Generally, a part is considered to pass if the minimum
magnitude of change is achieved. However, a part that changes
by more than the maximum magnitude is not necessarily a failure.


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