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ADS131E04IPAGR Arkusz danych(PDF) 2 Page - Texas Instruments |
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ADS131E04IPAGR Arkusz danych(HTML) 2 Page - Texas Instruments |
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2 / 60 page  ADS131E04 ADS131E06 ADS131E08 SBAS561A – JUNE 2012 – REVISED APRIL 2013 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FAMILY AND ORDERING INFORMATION(1) OPERATING NUMBER OF MAXIMUM SAMPLE TEMPERATURE PRODUCT PACKAGE OPTION CHANNELS ACCURACY RATE (kSPS) RANGE ADS130E08 TQFP-64 8 Class 1.0 8 –40°C to +105°C ADS131E04 TQFP-64 4 Class 0.1 64 –40°C to +105°C ADS131E06 TQFP-64 6 Class 0.1 64 –40°C to +105°C ADS131E08 TQFP-64 8 Class 0.1 64 –40°C to +105°C (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the device product folder at www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range, unless otherwise noted. VALUE UNIT AVDD to AVSS –0.3 to +5.5 V DVDD to DGND –0.3 to +3.9 V Analog input to AVSS AVSS – 0.3 to AVDD + 0.3 V Digital input to DVDD DGND – 0.3 to DVDD + 0.3 V Input current to any pin except supply pins(2) ±10 mA Momentary ±100 mA Input current Continuous ±10 mA Operating, industrial-grade devices only –40 to +85 °C Temperature Storage –60 to +150 °C Maximum junction, TJ +150 °C Human body model (HBM) ±1000 V JEDEC standard 22, test method A114-C.01, all pins Electrostatic discharge (ESD) ratings Charged device model (CDM) ±500 V JEDEC standard 22, test method C101, all pins (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied. (2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing beyond the supply rails must be current limited to 10 mA or less. 2 Submit Documentation Feedback Copyright © 2012–2013, Texas Instruments Incorporated Product Folder Links: ADS131E04 ADS131E06 ADS131E08 |
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